Patterns for Production Trace Enrichment: Collecting General Patterns in Manufacturing Environments Mark van der Pas,A.E. Akcay,R.M. Dijkman,I.J.B.F. AdanSSRN Electronic Journal(2024)引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要