Micro- and Nano-Roughness Separation Based on Fractal Analysis

Arpad Czifra, Erzsebet Ancza

MATERIALS(2024)

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摘要
When describing the tribological behaviour of technical surfaces, the need for full-length scale microtopographic characterization often arises. The self-affine of surfaces and the characterisation of self-affine using a fractal dimension and its implantation into tribological models are commonly used. The goal of our present work was to determine the frequency range of fractal behaviour of surfaces by analysing the microtopographic measurements of an anodised aluminium brake plunger. We also wanted to know if bifractal and multifractal behaviour can be detected in real machine parts. As a result, we developed a new methodology for determining the fractal range boundaries to separate the nano- and micro-roughness. To reach our goals, we used an atomic force microscope (AFM) and a stylus instrument to obtain measurements in a wide frequency range (19 nm-3 mm). Power spectral density (PSD)-based fractal evaluation found that the examined surface could not be characterised by a single fractal dimension. A new method capable of separating nano- and micro-roughness has been developed for investigating multifractal behaviour. The presented procedure separates nano- and micro-roughness based on the geometric characteristics of surfaces. In this way, it becomes possible to specifically examine the relationship between the micro-geometry that can be measured in each wavelength range and the effects of cutting technology and the material structure that creates them.
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关键词
roughness,dominant wavelength,fractal,full-length scale,microtopography,nano-roughness,power spectral density
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