A 4.13-GHz UHS Pseudo Two-Port SRAM With BL Charge Time Reduction and Flying Word-Line for HPC Applications in 4-nm FinFET Technology

Jeongkyun Kim, Byungho Yook, Youngo Lee,Taemin Choi, Kyuwon Choi, Chanho Lee, Juchang Lee, Hyeongcheol Kim, Seok Yun, Changhoon Do, Minwoo Kwak, Mijoung Kim,Yunrong Li,Hoyoung Tang, Jaeyoung Kim,Inhak Lee,Dongwook Seo,Sangyeop Baeck

IEEE JOURNAL OF SOLID-STATE CIRCUITS(2024)

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摘要
In this article, we present a 4.13-GHz ultrahigh-speed (UHS) pseudo two-port SRAM for high-performance computing (HPC) in 4-nm FinFET technology. By applying the bitline (BL) charge time reduction (BLCTR) with clamped BL discharge (CBLD) scheme that improves BL charge and write time, the flying word-line (WL) architecture that enhances WL enable time, and the dual address pumping (DAP) architecture with flip-flop that reduces read and write switching time and address latching time, the proposed pseudo two-port SRAM demonstrates a UHS performance with a 4.13-GHz operating speed. A test-chip using the proposed scheme and architecture is fabricated in Samsung 4 nm FinFET technology and demonstrates UHS pseudo two-port 32-Kb SRAM operating at 4.13 GHz under 0.85 V and 100 c conditions.
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关键词
Random access memory,Metals,Loading,FinFETs,Clocks,Signal integrity,Delays,6T SRAM,bitline (BL) charge time control,BL discharge level control,dual address pumping (DAP),flying word-line (WL),pseudo two-port SRAM,SRAM for high-performance computing (HPC),ultrahigh-speed (UHS) SRAM,WL driver with rebuffer
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