X-Ray Elemental Detection Scheme Based on Dual-Source Monochromatisation Technology

Mohai Yue,Qi Zhang, Zhiqi Huang,Yun Teng,Lan Rao,Feng Tian,Qinghua Tian,Yuanfeng Li, Meng Sun

2023 IEEE International Conference on Electrical, Automation and Computer Engineering (ICEACE)(2023)

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摘要
A solution utilizing dual-source monochromatization technique is proposed to address the imprecision issue in traditional single-source X-ray spectroscopy. The solution employs Ag and W elements as anode excitation materials in dual X-ray tubes. By utilizing a fully focusing hyperbolic bent crystal, it filters multi-colored X-rays with scattered light into a single wavelength, reducing interference noise in the sample's X-ray fluorescence spectrum. This approach enables a wider element detection range and improved measurement accuracy. Experimental results show that the proposed solution achieves a relative standard deviation of less than 3.86% in measuring copper ore samples. Compared to traditional single-source single-wavelength excitation, it can additionally detect MgO and Cr, reducing measurement error by approximately 10% and exhibiting good linear correlation in major element measurements.
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关键词
monochromatisation technology,dual source x-ray,elemental detection,copper concentrate samples,measurement accuracy
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