Electron-phonon coupling dictates electron mean free paths and negative thermal diffusion in metals

The spatiotemporal dynamics of the fundamental energy carriers in metals underpin the efficiency of a wide array of technologies. Although much progress in our understanding of the temporal response of electronic relaxation processes following an external field perturbation has been achieved, the spatial relaxation dynamics of electrons after excitation remains unclear. Here, we employ a scanning ultrafast microscopy with high spatial resolution to directly measure the mean free paths of electrons in different metals. We show that the strength of electron-phonon coupling not only dictates the mean free paths, but also controls a peculiar spatial shrinking of the electronic temperature profile immediately after the electrons have thermalized with the ‘colder’ lattice. More specifically, from our experimental tracking of the spatial relaxation profiles, a clear observation of an effective negative thermal diffusion is apparent for metals with weaker electron-phonon coupling, while for metals with stronger electron-phonon coupling, the negative thermal diffusion effect is not observable. Our spatiotemporal modeling based on the two-temperature approach provides evidence that although negative diffusion occurs universally for materials with two different species that have varying diffusivities and are thermodynamically coupled, effective negative diffusion is masked for cases with stronger coupling between the species.