谷歌浏览器插件
订阅小程序
在清言上使用

Development of micron-sized Ag-Si composite paste die attach material for highly stable microstructure during high temperate aging

2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)(2023)

引用 0|浏览4
暂无评分
摘要
Ag paste sinter exhibits many advantages over other interconnect technologies, such as high electrical/thermal conductivities and wide operation temperature beyond 300 °C. However, sintered Ag paste tend to coarsen rapidly during aging at high temperatures, while the pore size and numbers decrease simultaneously with shape change at high temperatures due to Oswald ripening. Recent studies show that the micromechanical properties and fracture behaviour of sintered Ag paste largely depend on its microstructure, which relates not only on its porosity but also upon the degree of necking growth among the Ag particles. In this study, we developed a micron-sized cost-effective Ag-Si composite paste die attach material for highly stable microstructure during high temperate aging. A stable microstructure of sintered Ag-Si composite paste during high temperature aging for the reliability of structure by SEM and EBSD analysis. In addition, because of Si possessed some properties as low Coefficient of Thermal Expansion (CTE) value, the Ag-Si composite paste also is looking forward to reduce the CTE mismatch with SiC, thus improve the reliability during harsh thermal cycling.
更多
查看译文
关键词
Microstructural Stability,Composite Paste,Die-attach Materials,High Temperature,Thermal Expansion,Ag Particles,Micromechanical Properties,Thermal Conductivity,Porous Structure,Grain Size,Bond Strength,Morphological Structure,Grain Boundaries,Shear Strength,Grain Growth,Large Pore Size,SEM Observation,Joint Structure,Pole Figure,Si Particles,Ag Layer,Si Layer,Pure Ag,Twin Boundaries
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要