Characterization of defects in Tb3Ga5O12 single crystals grown by the Czochralski method

Tb3Ga5O12 (TGG) single crystals, which are used as optical isolators, are grown using the Czochralski (Cz) method. Radial stripes are sometimes observed inside the TGG-grown single crystals. Polarized light microscopy, chemical etching, and X-ray topography results suggest that helical dislocations are present in crystals with radial stripes. Therefore, the radial stripes are considered to be caused by light scattering due to the strain resulting from helical dislocation.