Optical Constants and Thickness Determination of La2/3sr1/3mno3 Thin Films on Nb:Srtio3 Substrates by Spectro-Ellipsometry: Combination of Optical and X-Ray Techniques Jérémy Blond,Christian Dufour,Sandeep Kumar Chaluvadi,Sylvain Duprey,Xavier Portier,Philippe Marie,Victor Pierron,Laurence Méchin,Bruno Guilletcrossref(2024)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要