Effect of Zr/Ti Ratio on the Structure and Electrical Properties of 0.7PbZr_xTi_1-xO₃-0.3Pb(Zn< sub>1/3Nb_2/3)O₃ Piezoelectric Ceramics

Ternary system piezoelectric ceramics 0.7PbZr(x)Ti(1-x)O(3)-0.3 Pb(Zn1/3Nb2/3)O-3 (abbreviated as 0.7PZTx-0.3PZN) were prepared by a traditional solid-phase process. With the increase in Zr content, the electrical properties of the ceramics were significantly improved, and this result could be attributed to the change in the ceramic phase structure. The relationship between the change in Zr content and the ceramic phase structure and properties was investigated in detail by component modulation. X-ray diffraction (XRD) analyses showed that the phase structure of the ceramics undergoes a transition from the coexistence of tetragonal (T) and rhombohedral (R) phases to the predominance of rhombohedral (R) phases as the Zr content x increases. The phase structure of the ceramics at x = 0.49 is closer to the morphotropic phase boundary (MPB), with about 32% of the T-phase and 68% of the R-phase, and possesses good electrical properties: d33 = 483 pC/N, kp = 0.69, epsilon(r) = 2171.7, tan delta = 0.016, T-c = 292.5(degrees)C, Pr = 35.9 mu C/cm(2), E-c = 7.7 kV/mm. Constructing the MPB of 0.7PZT-(0.3)PZN piezoelectric ceramics by varying the Zr content can be effective in improving the electrical properties and understanding more broadly how the change in Zr/Ti composition affects the piezoelectric behavior.