Beyond the blur: using experimental point spread functions to help scanning Kelvin probe microscopy reach its full potential
arxiv(2024)
摘要
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for
investigating the electrostatic properties of material surfaces, enabling the
imaging of variations in work function, topology, surface charge density, or
combinations thereof. Regardless of the underlying signal source, SKPM results
in a voltage image which is spatially distorted due to the finite size of the
probe, long-range electrostatic interactions, mechanical and electrical noise,
and the finite response time of the electronics. In order to recover the
underlying signal, it is necessary to deconvolve the measurement with an
appropriate point spread function (PSF) that accounts the aforementioned
distortions, but determining this PSF is difficult. Here we describe how such
PSFs can be determined experimentally, and show how they can be used to recover
the underlying information of interest. We first consider the physical
principles that enable SKPM, and discuss how these affect the system PSF. We
then show how one can experimentally measure PSFs by looking at well defined
features, and that these compare well to simulated PSFs, provided scans are
performed extremely slowly and carefully. Next, we work at realistic scan
speeds, and show that the idealised PSFs fail to capture temporal distortions
in the scan direction. While simulating PSFs for these situations would be
quite challenging, we show that measuring PSFs with similar scan parameters
works well. Our approach clarifies the basic principles of and inherent
challenges to SKPM measurements, and gives practical methods to improve
results.
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