Wafer Scale Gallium Nitride Integrated Electrode Toward Robust High Temperature Energy Storage

SMALL(2024)

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摘要
Gallium Nitride (GaN), as the representative of wide bandgap semiconductors, has great prospects in accomplishing rapid charge delivery under high-temperature environments thanks to excellent structural stability and electron mobility. However, there is still a gap in wafer-scale GaN single-crystal integrated electrodes applied in the energy storage field. Herein, Si-doped GaN nanochannel with gallium oxynitride (GaON) layer on a centimeter scale (denoted by GaN NC) is reported. The Si atoms modulate electronic redistribution to improve conductivity and drive nanochannel formation. Apart from that, the distinctive nanochannel configuration with a GaON layer provides adequate active sites and extraordinary structural stability. The GaN-based supercapacitors are assembled and deliver outstanding charge storage capabilities at 140 degrees C. Surprisingly, 90% retention is maintained after 50 000 cycles. This study opens the pathway toward wafer-scale GaN single-crystal integrated electrodes with self-powered characteristics that are compatible with various (opto)-electronic devices. The N-type GaN nanochannel with a GaON layer on a centimeter scale is designed as an integrated electrode and assembled GaN-based SCs. The device displays excellent performance at 140 degrees C and behaves with great prospects as power electronic accessories compatible with GaN-based platform. image
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关键词
density functional theory,high temperature,integrated electrode,porous gallium nitride single crystal,single atom doping,supercapacitors
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