Noise-robust online measurement of the on-state resistance of the power semiconductor devices in PWM converters
IEEE Access（2024）
摘要
The on-state resistance of power semiconductor devices,
RDUT
, is used to estimate the remaining useful life (RUL) of the devices. Conventional online measurement of
RDUT
involves on-state voltage measurement of the on-state device, which is easily polluted by switching noise to limit the measurement accuracy. This paper proposes a new noise-robust method to measure the increment of
RDUT
by inductor current and input/output DC voltage of DC-DC converters. The proposed method features higher accuracy in predicting RUL than the conventional one because the inductor current is immune to switching noise. Experimental results showed 99.2% maximum accuracy between the actual and measured
RDUT
of sample MOSFETs.
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关键词
On-state resistance,remaining useful life (RUL),online monitoring,power semiconductor devices
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