Adding Diffuse Scattering Correlation to Effective Roughness Models in Ray Tracing

This paper proposes to add diffuse scattering correlation to Effective Roughness (ER) models used in ray tracing. Diffuse scattering correlation is modeled by phase evolution models including a deterministic part and a correlated (random) part. The deterministic part is dependent on the distance variations between the moving terminal and each ER tile, and the correlated part is related to the angular variations. The predicted narrowband radio channels by ray tracing with proposed diffuse scattering correlation are compared with those obtained by applying a reference physical optics approach, in terms of the properties over spatial frequency.