Data-Driven Test Plan Augmentation for Platform Verification.Wen Chen,Jayanta Bhadra,Kuo-Kai Hsieh, Li-Chung WangIEEE Design & Test(2017)SCI 3区SCI 4区NXP Semicond Inc被引用3|浏览19摘要This article points out that the fundamental problem of platform verification is incompleteness of the test plan and proposes an unsupervised learning approach to augment the test plan.-Magdy Abadir, Helic Inc.更多查看译文关键词Measurement,System-on-chip,Generators,Simulation,Formal verification,Systems architecturePDF原文链接分享引用加入学术空间AI Read Science数据免责声明页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cnAI 解读一键生成论文网页Chat Paper正在生成论文摘要