The continuous phase plate with a large wavefront gradient is used as the far-field beam shaping element in some high-power laser physics experiments. During the fabrication of continuous phase plate and before the actual use, it is necessary to measurement its wavefront to judge the fabrication quality and whether the wavefront distribution meets the requirement of use. By constructing a novel amplitude replacement phase retrieval algorithm with variable weighting factor, fast and high precision reconstruction of CPP with large wavefront gradient can be achieved. The proposed method is validated by numerical simulation and experiment.

The fully continuous spiral phase plate (SPP) has been used more and more widely in high-power laser and other fields. Its unique jump cross section structure with a width of only a few millimeters puts forward extremely high requirements for wavefront measurement. In this paper, a defocus multi-intensity phase retrieval algorithm based on weighted GS for wavefront measurement of SPP is proposed, and the influence of phase retrieval test error on measurement accuracy is analyzed. Finally, a phase retrieval test platform is established, and the high-precision phase retrieval measurement of the SPP wavefront is realized.

For lens-free imaging technology based on axial multi-plane phase retrieval, the test parameters have a very important impact on the image reconstruction speed and quality. The deviations between the actual position of the recorded diffraction intensity pattern and the set position in the reconstruction algorithm will also affect the image reconstruction quality. We analyzed the influence of test parameters and deviations on the reconstruction accuracy and proposed a method to correct the position mismatch of the intensity image. The effectiveness of the method is verified by simulation and experiment.

采用高质量的标准位相结构是实现光学干涉检测系统的系统传递函数精确校准及保证光学元件波前/表面中高频段信息准确检测的前提。通过对二元伪随机光栅结构和台阶位相结构两类典型表面进行模拟,分析了空间周期误差及跃变边缘陡度等制造误差对于检测系统传递函数校准的影响,并分析了检测系统CCD对二元伪随机光栅欠采样和过采样时功率谱密度（PSD）的变化。结果表明:存在同等制造误差时,二元伪随机光栅结构比台阶位相结构对检测系统传递函数中高频能够实现更高精度的校准;当对二元伪随机光栅存在欠采样或过采样时,均会造成PSD随频率的下降,可通过对理想二元伪随机光栅的高度分布进行相应的采样修正消除因采样对传递函数校准的影响。

对大口径连续相位板(CPP)在子孔径拼接检测过程中存在的几种影响检测精度的主要因素,包括定位误差、系统误差和拼接模式等进行了归纳并分析了其对检测精度的影响权重.通过对子孔径重叠区域分布的均匀性计算,分析了检测误差对拼接质量的影响.结果表明,定位误差是影响CPP拼接精度的主要原因,而对系统误差进行有效处理可以进一步减小重叠区非均匀性,拼接模式的选择对CPP的拼接结果的影响有限.通过CPP深度特性对重叠区域均匀性的统计分析表明,在像素级别的检测中,重叠区域均方根残差随着CPP深度的增加而线性增加,即拼接精度随CPP深度的增加而降低.