An accurate, temperature-dependent model has been developed for the DC I-V characteristic of an InP-based double heterojunction (DH) laser by parameter extraction using the ideal diode equation model. The parameters of the ideal diode equation can then be used to determine junction quality and reproducibility. The change in device parasitic resistance has been measured and its temperature dependence found. A relationship between threshold current and ideality factor is proposed. The deviation between the measured and modeled I-V characteristic can be used to determine threshold current accurately, independently of optical measurements.< >

An order of magnitude improvement in the specific contact resistance of gold-based ohmic contacts to p-type GaInAsP (Eg=1.13 eV) is reported. A novel technique using a silicon susceptor has been employed in a rapid thermal processor. A direct comparison between gold-based contacts annealed in a conventional furnace and the rapid thermal processor indicated a specific contact resistance of 4.2×10−5 and 4.1×10−6 Ω cm2, respectively. Auger electron spectroscopy, in depth profile mode, revealed two different metallurgical profiles for the conventional furnace and the rapid thermal processor. The rapid thermal processor was successfully implemented in a p-i-n optical detector process resulting in a reduction in the device series resistance and improved performance.