We present single event upset sensitivities for three Xilinx Virtex4 field-programmable-gate-array (FPGA) devices in protons and heavy ions. Upsets are identified in each functional block and results compared with previous device generations.
This work presents the results from heavy ion tests of Xilinx Virtex FPGA XQVR300 manufactured by Xilinx in a 0.25/spl mu/m technology. Virtex XQVR300 is an SRAM-based FPGA, which allows for real-time reconfigurable computing. Reprogrammable logic would offer the benefit of on-orbit design changes. Earlier SEU testing on this type of device has reported high sensitivity to heavy ions. Mitigation techniques of single event upsets in Virtex devices as triple module redundancy (TMR) and configuration readback (bitstream repair) have been developed by Xilinx and are tested in this work.