We present a detailed examination of the optical properties and electronic structure taken from photoreflectance and photoluminescence data collected on a series of short-period ZnS-ZnSe superlattices grown by low pressure metalorganic vapor phase epitaxy. We studied the band offset problem and calculated the exciton binding energy using several variational models. The temperature dependence of the photoluminescence properties of these superlattices was analyzed in the context of a model which includes the influence of the interfacial disorder.

The optical properties of ZnTe epilayers grown by low-pressure metal organic vapour phase epitaxy on GaAs and GaSb substrates are studied. The layers are grown by using the halide-free triethylamine dimethylzinc adduct and di-isopropyl telluride as zinc and tellurium precursors, respectively. A detailed analysis of the residual strain is offered as a function of layer thickness and substrate nature via reflectivity measurements performed at pumped liquid helium temperature. This is completed by an extensive analysis of near-band-edge photoluminescence spectra in order to discriminate the contribution of residual impurities. Using these precursors ZnTe layers with extremely low contamination rates are obtained.

We present a detailed study of the optical properties of short-period ZnS-ZnSe strained-layer superlattices. These superlattices have been grown by metalorganic vapor-phase epitaxy. We show that the photoluminescence exhibits a low-energy tail due to localization of the exciton to interfacial potential fluctuations. A detailed analysis of the electronic structure has been performed using the envelope-function approach to obtain the valence-band and conduction-band envelope functions and band lineups. This was completed by a self-consistent calculation of the exciton binding energies. In this calculation the marginal conduction-band offset deduced from the standard envelope-function calculation is corrected by the electrostatic deformation produced by the presence of a localized hole wave function.

We have studied the temperature dependence of the photoluminiscence of tellurium-doped ZnS-ZnSe superlattices. By comparing the reflectivity and photoluminescence data, we were able to identify both free exciton recombination and self-trapped exciton band energy split by 90 meV. The behaviour of the photoluminescence with temperature results from trapping versus detrapping effects which are ruled by an activation energy of 80 meV. This behaviour is analysed in the context of a configuration coordinate diagram.

Thin films of high-quality ZnS were grown on (001) GaAs and (111) Si substrates by metal-organic chemical-vapor deposition. 2-K reflectivity was used to analyze various samples grown at different temperatures. The spectra show two structures at 3.801 eV corresponding to the free exciton and at 3.871 eV corresponding to the ${\mathit{E}}_{0}$+${\mathrm{\ensuremath{\Delta}}}_{0}$ transition. Theoretical reflectivity spectra were calculated using the spatial dispersion model with two oscillators. Thus, the transverse energies, the longitudinal transversal splitting, the oscillator strengths, and the damping parameters were determined for both the free exciton and the split-off exciton of ZnS. Photoluminescence measurements were also carried out using an excimer laser (308 nm). Both light-hole and heavy-hole excitons were observed, which allow for the determination of the strain that exists in the layer. This strain is due only to the difference between the thermal-expansion coefficients of the GaAs substrate and the ZnS epilayer, and was demonstrated to be a tensile strain. This paper also presents results on the band-gap energy variation as a function of the temperature and photoluminescence spectra when the excitation was varied from weak to very high densities (15 MW/${\mathrm{cm}}^{2}$).

We have grown ZnSe/ZnS superlattices using low pressure MOVPE. The superlattices were grown onto a relaxed ZnSe buffer and were constituted of 45 periods. The well and barrier thicknesses were chosen from the calculation of critical thicknesses for coherent and free standing situations. Following this analysis we have grown samples with individual ZnSe, ZnS thicknesses of 3 to 9 monolayers.The optical properties of the samples were studied using photoluminescence, photoreflectance and reflectivity experiments. The results of the photoluminescence and photoreflectance experiments are consistent with a free standing model of the strain state, and a typical sketch of potential profile, describing the band structure of such superlattices is proposed. The photoluminescence linewidth is analyzed in terms of interface roughness. The asymmetry of the photoluminescence peaks is modelled using a density of state with a low energy exponential tail, due to the competition between radiative recombination and non-radiative recombination mechanisms. In some samples of lower crystalline quality, bound excitons were observed in the near band edge photoluminescence, which we attribute to impurity interdiffusion, which is favoured by crystalline defects.

The X-ray diffraction pattern of MOVPE-grown ZnSe/InP epilayers in the thickness range between 0.15 and 2.2 mum shows that the relaxation is obtained for a few monolayers. The splitting between light hole E(lh) and heavy hole E(hh) excitonic transitions is observed at 4.2 K by reflectivity and is explained in terms of thermoelastic strain due to the difference in the thermal expansion coefficients of layer and substrate. In addition photoluminescence is studied and shows neutral-donor-bound-exciton lines I2 and I2' as well as the neutral-acceptor-bound-exciton line I1.

Epitaxial ZnSe, ZnTe and multilayers have been grown on III-V ( InP, GaAs and GaSb ) substrates by organometallic vapor phase epitaxy. First, the OMVPE growth technique used is described. The microstructural quality of the epilayers was determined by SEM (EDX) and X-Ray diffraction. Mechanichal strain, due firstly to a mismatch between II-VI layers and III-V substrates and secondly to different thermal expansion coefficients is studied. Reflectivity and photoluminescence spectra are presented for one type of material. Growth parameters are identified arid problems associated to experimental conditions are discussed.