Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Extract HTML view is not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button. Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Extract HTML view is not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button. Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

The orientation dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps [Nishikawa and Kikuchi, Nature (London) 121, 1019 (1928)]. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of crystallographic information from lattice images. In particular, these maps can help researchers to determine the three-dimensional lattice of individual nanocrystals, to “fringe-fingerprint” collections of randomly oriented particles, and to measure local specimen thickness with only a modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help from more precise goniometers) will be more useful as aberration correction moves resolutions into the subangstrom range.

Journal Article Image-based 3D Nanocrystallography by Means of Tilt Protocol/Lattice-Fringe Fingerprinting with Contemporary Side-entry Specimen Goniometers Get access P Moeck, P Moeck Portland State University, Portland, Oregon Search for other works by this author on: Oxford Academic Google Scholar B Seipel, B Seipel Portland State University, Portland, Oregon Search for other works by this author on: Oxford Academic Google Scholar W Qin, W Qin Freescale Semiconductor, Chandler, Arizona Search for other works by this author on: Oxford Academic Google Scholar E Mandell, E Mandell University of Missouri St. Louis, St. Louis, Missouri Search for other works by this author on: Oxford Academic Google Scholar P Fraundorf P Fraundorf University of Missouri St. Louis, St. Louis, Missouri Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 11, Issue S02, 1 August 2005, Pages 632–633, https://doi.org/10.1017/S1431927605500564 Published: 01 August 2005