Ion microscopy is an established technique for laser focus diagnostics and the accurate, intensity-resolved measurement of laser ionization processes. In the present feasibility study, we discuss a new ion microscope design, which improves its resolution across a large range of magnifications and simplifies its operation. Instead of the common two einzel lens configuration, which is usually optimized for a fixed magnification, we propose a generic design consisting of an array of equally spaced ring electrodes, whose individually adjustable voltages are controlled by an evolutionary algorithm. In this way, we can realize aberration minimized magnifications between 25 and 100. Moreover, the algorithm can adjust the voltage settings under changing experimental conditions and facilitates autofocusing for user-defined magnification.

The interpretation of experimental data from novel mid-infrared few-cycle laser sources requires an understanding of ionization mechanisms and knowledge about related ion yields. Experimental studies have indicated sequential double ionization as the dominant process above 1014 W cm−2. These results contradict a recent prediction that in this spectral region, non-sequential processes dominate the double ionization of xenon up to intensities of about 1015 W cm−2. In either case, the ratio of doubly to singly charged xenon yield reported in previous studies has been limited to a few percent, indicating a regime well below the onset of saturation of the double ionization process. We present an experimental study of double ionization of xenon and krypton atoms exposed to intense near four-cycle pulses at 3.2 μm. Our experiments rely on the ion microscopy technique, which facilitates the detection of ions originating from a restricted region within the interaction volume, thereby reducing the impact of focal averaging. Our measurements suggest that at intensities of close to 1.2 × 1014 W cm−2, double ionization of xenon and krypton is already significantly saturated. In particular, we find a doubly to singly charged yield ratio of about 75 percent for xenon and 25 percent for krypton. We compare our results with the predictions of different models accounting for the effects of volume averaging and focal geometry. We find that in the deeply saturated regime of our experiment, the Perelomov–Popov–Terentyev theory significantly underestimates the observed double ionization yield.