Self-sensing and –actuating probes optimized for conventional tapping mode atomic force microscopy (AFM) are described. 32-kHz quartz tuning forks with a chemically etched and focus ion beam (FIB) sharpened (curvature radii are 5-10 nm) tungsten tip are stable at air and liquid nitrogen atmosphere and at a wide range of temperatures. If driven at constant frequency, the scan speed of such sensors can be up to 3 Hz. AFM was performed on polymer samples in order to study the stability and applicability of these sensor for investigation of soft materials with high dynamical tendencies.
Ferdinand Hofer合作论文数Institute of Physical and Theoretical Chemistry, Graz University of Technology/Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology/Anton Paar GmbH2
Anton E. Efimov合作论文数2
Werner Grogger合作论文数Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology;Institute of Solid State Physics, Graz University of Technology2Nadezda Matsko合作论文数1Matsko Nadejda B合作论文数1
Stefan Mitsche合作论文数1Helmut Gnaegi合作论文数1Julian Wagner合作论文数1
