Results: A good fit of the data was obtained in 12 out of 15 cases (estimated OAVD uncertainty < 2511x).OAVD at rest was 126.0&33.111x in VDD mode, 165.5&32.4ms in DDD mode.OAVD under effort was 120.6&24.111x in VDD mode, 133.8&20.911x in DDD mode.OAVD uncertainty evaluation gave 6.8&4.4ms at rest vs ?.9&4.6msunder effort (pas).Conclusion: automatic recording of the PEA I vs AV Delay curve is easily obtained under effort as well as at rest.The sigmoid fit was good in the majority of cases (80%).OAVD determination by analysis of PEA with the proposed algorithm is possible in all conditions through the implanted device.