Scanning Near-field Optical Microscopy (SNOM) allows optical microscopy with highest spatial resolution beyond the diffraction limit. We present a new microscope set-up which uses micro-machined cantilever SNOM sensors and combines in a unique way the advantages of Scanning Near-field Optical Microscopy, Confocal Scanning Microscopy (CSM) and Atomic Force Microscopy (AFM) in one instrument. Results from measurement at different samples system like histological microtome cuts and fluorescent labelled human chromosomes are shown to demonstrate the capabilities of the new set-up.