In free electron laser (FEL) systems with ultraviolet (UV) laser driven injectors, a highly stable UV source generated through cascaded third harmonic generation (THG) from an infrared (IR) source is a key element in guaranteeing the acceptable current jitter at the undulator. In this letter, the negative slope of the THG efficiency for high intensity ultrashort IR pulses is revealed to be a passive stabilization mechanism for energy jitter reduction in UV. A reduction of 2.5 times the energy jitter in UV is demonstrated in the experiment and simulations show that the energy jitter in UV can be reduced by more than one order of magnitude if the energy jitter in IR is less than 3%, with proper design of the THG efficiency curve, fulfilling the challenging requirement for UV laser stability in a broad scope of applications such as the photoinjector of x-ray FELs.

We report on investigations into the fundamental surface emission parameters, the geometric field enhancement factor (β) and the work function (φ), by making both field emission and Schottky-enabled photoemission measurements. The measurements were performed on a copper surface in the Tsinghua University S-band RF gun in two separate experiments. Fitting our data to the models for each experiment indicate that the traditionally assumed high value of β(≈50-500) does not provide a plausible explanation of the data, but incorporating a low value of φ at some sites does. In addition, direct measurements of the surface conducted after the experiment show that β is on the order of a few, consistent with our understanding of the electron emission measurements. Thus we conclude that the dominant source of electron emission in high gradient RF cavities is due to low φ sites, as opposed to the conventionally assumed high β sites. The origin of low φ at these sites is unclear and should be the subject of further investigation.

We report on dark current and Schottky-enabled photoemission from a copper photocathode surface. Field-emitted dark current is a major gradient-limiting factor in RF cavities. Field emission is generally attributed to geometrical projections on the bulk surface whose field enhancement factor (beta) and the emitting area (A(e)) can be extracted from the Fowler-Nordheim (FN) plot. Measurements were made at Tsinghua S-band RF gun facility in two separate experiments. Using the traditional FN formula for RF fields we discovered that field enhancement factor (beta) alone cannot explain the full data set. Instead, we found that a low work function at some sites is required. In addition, surface analysis of the cathode after the experiment shows that geometric beta indicated would be < 10. Thus we conclude that low work function sites with a small beta are responsible for dark current emission and subsequent breakdown in high-gradient structures. The origin of these sites is unclear but could be due to defects or impurities.