We propose a novel technique allowing the use of the three-cornered-hat method with two devices under test (DUTs) and a time-tagging system that employs a common reference oscillator. The precision of a time-tagging system is reduced by fluctuations in the timebase, which are canceled when the relative phase between the two DUTs is measured. However, the raw time-tags in this system provide a phase comparison between the DUTs and the system timebase, allowing the use of the three-cornered hat with some dual-channel measurement instruments.
Waddah a Alashwal合作论文数Sch. of Electr. & Electron. Eng., Univ. of Adelaide;c;Sch. of Electr. & Electron. Eng., Univ. of Adelaide1
Derek Abbott合作论文数School of Electrical and Electronic Engineering, University of Adelaide;College of Engineering and Information Technology, University of Adelaide1
Lachlan J. Gunn合作论文数1
Andrew Allison合作论文数School of Electrical and Mechanical Engineering, Faculty of Sciences, Engineering and Technology, University of Adelaide1
John G. Hartnett合作论文数1
