Information on traceability of parts and lots is a key component of Radiation Hardness Assurance (RHA), but experiences growing difficulty with the increased use of Commercial off the shelf (COTS) parts. Various methods are investigated in this work to characterize the lot-to-lot variability and determine whether an optimal sample size can be determined. Comparisons are made to previous studies and the legitimacy of core assumptions are challenged and investigated.

Single event effects testing of semiconductors for use in space and other radiation environments is an indispensable requirement for maximising reliability and mission lifetime. The available capacity at heavy ion facilities has been outstripped by demand and pulsed laser test systems offer a quicker and lower cost alternative for many situations. Examples where laser test systems are a better solution, such as part screening and product development, are defined and the benefits explained. SEREEL2 is a new laser test system that is reliable, stable and easy to use. Key elements of the system are described and test data presented. These data are compared with results obtained from other systems, demonstrating the effectiveness of SEREEL2. Used appropriately, laser test systems can improve development times, reduce costs and increase reliability.

This work describes the results of a series of total dose radiation tests on 1,000 samples of LM239N quad comparators sourced from ten date codes, split evenly between two manufacturers. The primary aim was to facilitate a better understanding of the impact of sample size on the relevance and applicability of TID testing results, especially for COTS parts. The irradiation was carried out according to industry standard best practice with gamma radiation from a cobalt-60 source. The results for input bias current, input offset current and input offset voltage are presented and discussed. Trends and distinctions between the manufacturers and date codes are identified.