Journal Article Spatial Resolution Smaller Than the Pixel Size? Yes we can! Get access Lothar Strüder, Lothar Strüder PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, GermanyUniversity of Siegen, Walter-Flex-Strasse 3, 57072 Siegen, Germany Search for other works by this author on: Oxford Academic Google Scholar Jeffrey M Davis, Jeffrey M Davis PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Robert Hartman, Robert Hartman PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Peter Holl, Peter Holl PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Sebastian Ihle, Sebastian Ihle PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar David Kalok, David Kalok PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Heike Soltau Heike Soltau PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 90–91, https://doi.org/10.1017/S1431927617001131 Published: 04 August 2017

Scanning electron microscope based X-ray EDS analysis and micro focused X-ray fluorescence (µXRF) analysis typically rely on a focused beam to create X-ray images.The beam is addressed to an array of points on a sample, and a full X-ray spectrum is recorded at each point.An X-ray spectrum is a one dimensional data structure where the intensity (usually measured in arbitrary units known as "counts") is a function of energy.Recording these one dimensional data structures at each point in an array creates a three dimensional data structure known as an X-ray spectrum image (XSI).As a technique, X-ray imaging has proved useful in a wide variety of fields, and it was particularly improved by the invention of the silicon drift detector, which reduced the time required to acquire an XSI by a factor of ten or more [1].

Journal Article Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities Get access Jeffrey M Davis, Jeffrey M Davis PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Julia Schmidt, Julia Schmidt PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Martin Huth, Martin Huth PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Robert Hartman, Robert Hartman PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Heike Soltau, Heike Soltau PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany Search for other works by this author on: Oxford Academic Google Scholar Lothar Strüder Lothar Strüder PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, GermanyUniversity of Siegen, Walter-Flex-Strasse 3, 57072 Siegen, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 200–201, https://doi.org/10.1017/S1431927617001684 Published: 04 August 2017