A number of technologies are available to increase the abundance of DNA markers and contribute to developing high resolution genetic maps suitable for genetic analysis. The aim of this study was to expand the number of Diversity Array Technology (DArT) markers on the wheat array that can be mapped in the wheat genome, and to determine their chromosomal location with respect to simple sequence repeat (SSR) markers and their position on the cytogenetic map. A total of 749 and 512 individual DArT and SSR markers, respectively, were identified on at least one of four genetic maps derived from recombinant inbred line (RIL) or doubled haploid (DH) populations. A number of clustered DArT markers were observed in each genetic map, in which 20–34% of markers were redundant. Segregation distortion of DArT and SSR markers was also observed in each mapping population. Only 14% of markers on the Version 2.0 wheat array were assigned to chromosomal bins by deletion mapping using aneuploid lines. In this regard, methylation effects need to be considered when applying DArT marker in genetic mapping. However, deletion mapping of DArT markers provides a reference to align genetic and cytogenetic maps and estimate the coverage of DNA markers across the wheat genome.

Septoria nodorum blotch is the most important leaf disease of wheat in Western Australia. A potentially useful source of resistance has been identified in an accession of Aegilops tauschii. To study the genetics of resistance of this source a cross was made between the resistant Ae. tauschii accession, RL5271, and a susceptible accession, CPI110889. The resistant parent took significantly longer to develop symptoms, developed significantly fewer lesions and expressed significantly lower levels of disease than the susceptible parent. The F1 mean response for disease severity indicated there was no complete dominance. The F3 families were classified using three approaches. In the first approach the individual F3 plant response was used to classify the F3 families. In the second approach the F3 family means and standard errors were used to classify the F3 families. In the final approach Best Linear Unbiased Predictors of disease score and standard error for each F3 family derived from a REML analysis were used to classify the F3 families. The genotypic ratios generated by each of the approaches suggested that resistance is controlled by a single gene. The effectiveness of the resistance and its simple genetic control in the Ae. tauschii, accession RL5271 may be a useful resistance source for use in a bread wheat breeding program.

A strong association between the absence of the granule-bound starch synthase (GBSS) protein for the 4A chromosome of wheat and Japanese Udon noodle quality has been previously described. The aim of this study was to identify a molecular marker linked to the GBSS 4A locus which could be used to identify wheat with the desired texture for Udon noodles. PCR primers were designed to target this gene which gave a 440 bp PCR band, corresponding to the presence or absence of the 4A GBSS gene. Of the 268 genotypes screened with these primers, 267 were correctly identified using the PCR primers. The remaining genotype was shown to be heterogeneous for the marker. The PCR marker test developed has advantages over existing methods used to screen for Udon noodle starch quality as it enables high throughput, accurate tests to be carried out on leaves of young seedlings or mature seed and identify breeding lines that are heterogeneous for the 4A allele which will allow for reselections. Application of this PCR test will speed up selection for Udon noodle quality genotypes and reduce breeding costs for production of noodle wheat varieties. Abbreviations: CTAB, cetyltrimethlammonium bromide; FSV, flour swelling volume; GBSS, granule-bound starch synthase; IEF, isoelectric focusing; PCR, polymerase chain reaction; SDS-PAGE, sodium dodecyl sulfate-polyacrylamide-gel electrophoresis.