We have developed a light-emitting device, called the ZOGAN light-emitting diode (LED). The ZOGAN LED is formed with the p-layer composed of both ZnO-based oxide and GaN-based nitride semiconductors. The ZOGAN LED shows the characteristics of light-emitting devices required for ultra-high-resolution displays.

Scaling-down is the most significant technical strategy to improve performance for microelectronic devices, which is first performed systematically by Robert H. Dennard for silicon integrated circuits. Its main idea is that device parameters such as doping and junction depth must be adjusted when shrinking the dimensions of a field-effect transistor so that the power density can remain unchanged. Recently, miniaturization of light-emitting diodes or "microscale light-emitting diodes (Micro-LEDs)" is gaining much attention because of their potential for superior display technologies. However, the scaling-down of LEDs used for solid-state lighting (SSL) results in extremely low efficiency devices, with the reasons and underlying device physics still unclear. Here the law of Micro-LED scaling is proposed in analogy to Dennard scaling, through which new perspectives are provided to comprehensively understand the root cause of Micro-LED inefficiency and the scientific challenges to be addressed for mass commercialization, including subthreshold radiation, size-dependent effect, and the enhancement of carrier recombination at low current density.

Characterization of operational AlGaInN heterostructure light emitting diodes (LEDs) is critical to their performance optimization and time-to-failure analysis. Typically, device performance data needs to be corroborated with structural information such as layer thicknesses, charge profiles, and the absolute location of the pn-junction. Here, non-destructive testing by capacitance-voltage profiling is being applied to AlGaInN LED structures. Within a large set of samples with different active layer geometry, we observe distinct layers of high mobile charge accumulation. We correlate those with layer thicknesses derived from an x-ray diffraction analysis of the corresponding epiwafers. In this way, we identify the charge maxima as the upper and lower interfaces of the p-type AlGaN electron blocking layer to the neighboring GaN layers. By means of this successful analysis, we now have the opportunity to monitor epi process performance and stability as well as device degradation progress quasi-continuously over the device lifetime in a non-destructive mode.

A dual-functional ultraviolet (UV) photodetector with a large UV-to-visible rejection ratio is presented, in which interdigitated finger-type two-dimensional graphene electrodes are introduced to an AlGaN/GaN heterostructure. Two photocurrent generation mechanisms of photovoltaic and photoconductive dominances coexist in the device. The dominance of the mechanisms changes with the induced bias voltage. Below a threshold voltage, the device showed fairly low responsivities but fast response times, as well as a constant photocurrent against the induced bias. However, the opposite characteristics appeared with high bias voltage. Specifically, above the threshold voltage, the device showed high responsivities with additional gain, but slow rise and recovery times. For instance, the responsivity of 10.9 A/W was observed with the gain of 760 at the induced bias voltage of 5 V. This unique multifunctionality enabled by the combination of an AlGaN/GaN heterostructure with graphene electrodes facilitates the development of a single device that can achieve multiple purposes of photodetection.

We present and analyze three powerful long-term historical trends in the electrification of energy by free-fuel sources. These trends point toward a future in which energy is affordable, abundant, and efficiently deployed; with major economic, geo-political, and environmental benefits to humanity. We present and analyze three powerful long-term historical trends in energy, particularly electrical energy, as well as the opportunities and challenges associated with these trends. The first trend is from a world containing a diversity of energy currencies to one whose predominant currency is electricity, driven by electricity's transportability, exchangeability, and steadily decreasing cost. The second trend is from electricity generated from a diversity of sources to electricity generated predominantly by free-fuel sources, driven by their steadily decreasing cost and long-term abundance. These trends necessitate a just-emerging third trend: from a grid in which electricity is transported unidirectionally, traded at near-static prices, and consumed under direct human control; to a grid in which electricity is transported bidirectionally, traded at dynamic prices, and consumed under human-tailored artificial agential control. These trends point toward a future in which energy is not costly, scarce, or inefficiently deployed but instead is affordable, abundant, and efficiently deployed; with major economic, geo-political, and environmental benefits to humanity.

Fundamental limitations of wide-bandgap semiconductor devices are caused by systematic trends of the electron and hole effective mass, dopant ionization energy, and carrier drift mobility as the semiconductor's bandgap energy increases. We show that when transitioning from narrow-bandgap to wide-bandgap semiconductors the transport properties of charge carriers in pn junctions become increasingly asymmetric and characterized by poor p-type transport. As a result, the demonstration of viable devices based on bipolar carrier transport, such as pn junction diodes, bipolar transistors, light-emitting diodes (LEDs), and lasers, becomes increasingly difficult or even impossible as the bandgap energy increases. A systematic analysis of the efficiency droop in LEDs is conducted for room temperature and cryogenic temperature and for emission wavelengths ranging from the infrared, through the visible (red and blue), to the deep-ultraviolet part of the spectrum. We find that the efficiency droop generally increases with bandgap energy and at cryogenic temperatures. Both trends are consistent with increasingly asymmetric carrier-transport properties and increasingly weaker hole injection as the bandgap energy of LEDs increases, indicating that fundamental limitations of wide-bandgap semiconductor devices are being encountered.

About twenty years ago, in the autumn of 1996, the first white light-emitting diodes (LEDs) were offered for sale. These then-new devices ushered in a new era in lighting by displacing lower-efficiency conventional light sources including Edison's venerable incandescent lamp as well as the Hg-discharge-based fluorescent lamp. We review the history of the conception, improvement, and commercialization of the white LED. Early models of white LEDs already exceeded the efficiency of low-wattage incandescent lamps, and extraordinary progress has been made during the last 20 years. The review also includes a discussion of advances in blue LED chips, device architecture, light extraction, and phosphors. Finally, we offer a brief outlook on opportunities provided by smart LED technology.

The effect of strongly-imbalanced carrier concentration and mobility on efficiency droop is studied by comparing the onset voltage of high injection, the onset current density of the droop, and the magnitude of the droop, as well as their temperature dependence, of GaInN-based blue and green light-emitting diodes (LEDs). An n-to-p asymmetry factor is defined as σn/σp, and was found to be 17.1 for blue LEDs and 50.1 for green LEDs. Green LEDs, when compared to blue LEDs, were shown to enter the high-injection regime at a lower voltage, which is attributed to their less favorable p-type transport characteristics. Green LEDs, with lower hole concentration and mobility, have a lower onset current density of the efficiency droop and a higher magnitude of the efficiency droop when compared to blue LEDs. The experimental results are in quantitative agreement with the imbalanced carrier transport causing the efficiency droop, thus providing guidance for alleviating the phenomenon of efficiency droop.

The temperature-dependent external quantum efficiencies (EQEs) were investigated for a 620 nm AlGaInP red light-emitting diodes (LEDs), a 450 nm GaInN blue LED, and a 285 nm AlGaN deep-ultraviolet (DUV) LED. We observed distinct differences in the variation of the EQE with temperature and current density for the three types of LEDs. Whereas the EQE of the AlGaInP red LED increases as temperature decreases below room temperature, the EQEs of GaInN blue and AlGaN DUV LEDs decrease for the same change in temperature in a low-current density regime. The free carrier concentration, as determined from the dopant ionization energy, shows a strong material-system-specific dependence, leading to different degrees of asymmetry in carrier concentration for the three types of LEDs. We attribute the EQE variation of the red, blue, and DUV LEDs to the different degrees of asymmetry in carrier concentration, which can be exacerbated at cryogenic temperatures. As for the EQE variation with temperature in a high-current density regime, the efficiency droop for the AlGaInP red and GaInN blue LEDs becomes more apparent as temperature decreases, due to the deterioration of the asymmetry in carrier concentration. However, the EQE of the AlGaN DUV LED initially decreases, then reaches an EQE minimum point, and then increases again due to the field-ionization of acceptors by the Poole-Frenkel effect. The results elucidate that carrier transport phenomena allow for the understanding of the droop phenomenon across different material systems, temperatures, and current densities.

While there is an urgent need for semiconductor-based efficient deep ultraviolet (DUV) sources, the efficiency of AlGaN DUV light-emitting diodes (LEDs) remains very low because the extraction of DUV photons is significantly limited by intrinsic material properties of AlGaN. Here, we present an elegant approach based on a DUV LED having multiple mesa stripes whose inclined sidewalls are covered by a MgF2/Al omni-directional mirror to take advantage of the strongly anisotropic transverse-magnetic polarized emission pattern of AlGaN quantum wells. The sidewall-emission-enhanced DUV LED breaks through the fundamental limitations caused by the intrinsic properties of AlGaN, thus shows a remarkable improvement in light extraction as well as operating voltage. Furthermore, an analytic model is developed to understand and precisely estimate the extraction of DUV photons from AlGaN DUV LEDs, and hence to provide promising routes for maximizing the power conversion efficiency.

Despite a rapidly-growing demand for efficient man-made DUV light sources, widespread adoption of AlGaN-based DUV LEDs is currently obstructed by extremely poor extraction of DUV photons due to the intrinsic material properties of AlGaN including low hole concentration and poor light extraction efficiency (LEE). Conventional LEE-enhancing techniques used for GaInN-based visible LEDs turned out to be ineffective for DUV LEDs due to a strong absorption of DUV light by p-GaN contact layer, and predominant TM polarized anisotropic emission from Al-rich AlGaN multi-quantum well (MQW) active region grown on c-plane sapphire substrate. Therefore, a new LEE-enhancing approach addressing the unique intrinsic property of AlGaN DUV LEDs is strongly desired.In this study, we present DUV LEDs having arrays of TC shaped active mesas coated with MgF2/Al reflectors on the inclined sidewalls to extract strong TM-polarized in-plane emission trough the sapphire substrate. Ray tracing simulations reveal that the TC DUV LEDs show an isotropic emission pattern and much enhanced light-output power in comparison with stripe-type DUV LEDs with the same MgF2/Al reflectors. Consistent with the ray tracing simulation results, the TC DUV LEDs show an isotropic emission pattern with 37.1% higher light-output power as well as lower operating voltage than the stripe-type DUV LEDs. Based on our results, we suggest strategies to design an optimized DUV LEDs for further enhancing the optical and electrical performances simultaneously. In addition, we propose a next generation DUV LED with an array of Al nanoparticles capable of enhancing IQE and LEE simultaneously by surface plasmon resonance coupling.

Nitride-based ultraviolet light-emitting diodes (UV LEDs) are promising replacements for conventional UV lamps. However, the external quantum efficiency of UV LEDs is much lower than for visible LEDs due to light absorption in the p-GaN contact and electrode layers, along with p-AlGaN growth and doping issues. To minimize such absorption, we should obtain direct ohmic contact to p-AlGaN using UV-transparent ohmic electrodes and not use p-GaN as a contact layer. Here, we propose a glass-based transparent conductive electrode (TCE) produced using electrical breakdown (EBD) of an AlN thin film, and we apply the thin film to four (Al)GaN-based visible and UV LEDs with thin buffer layers for current spreading and damage protection. Compared to LEDs with optimal ITO contacts, our LEDs with AlN TCEs exhibit a lower forward voltage, higher light output power, and brighter light emission for all samples. The ohmic transport mechanism for current injection and spreading from the metal electrode to p-(Al)GaN layer via AlN TCE is also investigated by analyzing the p-(Al)GaN surface before and after EBD.

Revised and fully up-dated, the second edition of this graduate textbook offers a comprehensive explanation of the technology and physics of LEDs such as infrared, visible-spectrum, ultraviolet, and white LEDs made from III-V semiconductors. Elementary properties such as electrical and optical characteristics are reviewed, followed by the analysis of advanced device structures. With nine additional chapters, the treatment of LEDs has been vastly expanded, including new material on device packaging, reflectors, UV LEDs, III-V nitride materials, solid-state sources for illumination applications, and junction temperature. Radiative and non-radiative recombination dynamics, methods for improving light extraction, high-efficiency and high-power device designs, white-light emitters with wavelength-converting phosphor materials, optical reflectors, and spontaneous recombination in resonant-cavity structures are discussed in detail. With exercises, solutions, and illustrative examples, this textbook will be of interest to scientists and engineers working on LEDs and graduate students in electrical engineering, applied physics, and materials science.

Indium tin oxide (ITO) thin films deposited using the oblique angle deposition (OAD) technique exhibit a strong correlation between structural and optical properties, especially the optical bandgap energy. The microstructural properties of ITO thin films are strongly influenced by the tilt angle used during the OAD process. When changing the tilt angle, the refractive index, porosity, and optical bandgap energy of ITO films also change due to the existence of a preferential growth direction at the interface between ITO and the substrate. Experiments reveal that the ITO film's optical bandgap varies from 3.98 eV (at normal incident deposition) to 3.87 eV (at a 60° tilt angle).

The external quantum efficiency (EQE) of a GaInN green light-emitting diode (LED) is improved by inserting a p-type ZnO layer between the indium tin oxide electrode and the p-type GaN layer. Several hypotheses are discussed to explain the EQE improvement in the LED with the ZnO layer. It is concluded that higher hole injection efficiency and better electron confinement explain the EQE improvement, which is supported by the results of device simulations showing that the EQE is sensitive to the polarization sheet charge density at the interface between the last quantum barrier and electron-blocking layer.

While the demand for deep ultraviolet (DUV) light sources is rapidly growing, the efficiency of current AlGaN-based DUV light-emitting diodes (LEDs) remains very low due to their fundamentally limited light-extraction efficiency (LEE), calling for a novel LEE-enhancing approach to deliver a real breakthrough. Here, we propose sidewall emission-enhanced (SEE) DUV LEDs having multiple light-emitting mesa stripes to utilize inherently strong transverse-magnetic polarized light from the AlGaN active region and three-dimensional reflectors between the stripes. The SEE DUV LEDs show much enhanced light output power with a strongly upward-directed emission due to the exposed sidewall of the active region and Al-coated selective-area-grown n-type GaN micro-reflectors. The devices also show reduced operating voltage due to better n-type ohmic contact formed on the regrown n-GaN stripes when compared with conventional LEDs. Accordingly, the proposed approach simultaneously improves optical and electrical properties. In addition, strategies to further enhance the LEE up to the theoretical optimum value and control emission directionality are discussed.

The efficiency of Ga0.87In0.13N/GaN single and multiple quantum well (QW) light-emitting diodes is investigated under photoluminescence (PL) and electroluminescence (EL) excitation. By measuring the laser spot area (knife-edge method) and the absorbance of the GaInN QW (transmittance/reflectance measurements), the PL excitation density can be converted to an equivalent EL excitation density. The EL efficiency droop-onset occurs at an excitation density of 2.08 × 1026 cm–3 s–1 (J = 10 A/cm2), whereas no PL efficiency droop is found for excitation densities as high as 3.11 × 1027 cm–3 s–1 (J = 149 A/cm2). Considering Shockley–Read–Hall, radiative, and Auger recombination and including carrier leakage shows that the EL efficiency droop is consistent with a reduction of injection efficiency.

The efficiency droop in GaInN/GaN blue light-emitting diodes (LEDs) usually commences at current density around 10 A/cm2 and the efficiency decreases monotonically after the droop onset. GaN-based LEDs suffer seriously, at typical operating current densities (10–100 A/cm2), by the efficiency droop. Efficiency re-climbing is observed in the typical droop regime at cryogenic temperatures below 125K. The “efficiency re-climbing” coincides with a distinct increase in device conductivity, which is mainly attributed to an enhancement in p-type conductivity due to field ionization of acceptors. The “efficiency re-climbing” phenomenon implies an approach of solving efficiency droop by enhancing hole injection by external electric field.