Porous silicon has many properties useful for optics applications, which include an ability to produce thin films with a wide range of refractive indices and the ability to easily fabricate multilayer structures. However porous silicon does have some non-optimal properties due to the very nature of its porous structure, namely its large surface area. The porous silicon surface is quite reactive making properties of porous silicon thin films, such as refractive index, unstable in an ambient environment. The purpose of this work is to investigate the aging of porous silicon and the effects of aging on the optical and physical properties of the thin films. Reflectance and FTIR spectroscopy are used to investigate the porous silicon layers by observing shifts in optical thickness and changes in chemical structure of the thin films. The aging process was simulated by annealing samples at temperatures such that only reactions that occur at room temperature were promoted.
Giacinta Parish合作论文数School of Engineering, University of Western Australia1
Timothy D. James合作论文数Sch. of Phys., Univ. of Melbourne;c;Sch. of Phys., Univ. of Melbourne1
Adrian Keating合作论文数School of Electrical, Electronic & Computer Engineering, The University of Western Australia1
Charles Musca合作论文数1
Lorenzo Faraone合作论文数Department of Electrical, Electronic and Computer Engineering, School of Engineering, The University of Western Australia;Institute of Agriculture, The University of Western Australia;WA Centre for Semiconductor Optoelectronics and Microsystems1
