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全面呈现 [T. D. Minto] 的学术影响力

深度挖掘高质量成果与权威引用，让优秀看得见

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按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选

1Total Dose Bias Dependency and ELDRS Effects in Bipolar Linear Devices

CC Yui,SS McClure,BG Rax,JM Lehman,TD Minto,MD Wiedeman

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

20022002 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD引用：10

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2Total dose dependency and ELDRS effects on bipolar linear devices

C C Yui,S S Mcclure,B G Rax,J M Lehman,T D Minto,Michael D Wiedeman

2002引用：22

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全面呈现 [T. D. Minto] 的学术影响力

深度挖掘高质量成果与权威引用，让优秀看得见

论文（2）

专利

基金项目

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选

1Total Dose Bias Dependency and ELDRS Effects in Bipolar Linear Devices

CC Yui,SS McClure,BG Rax,JM Lehman,TD Minto,MD Wiedeman

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

20022002 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD引用：10

引用

AI阅读

2Total dose dependency and ELDRS effects on bipolar linear devices