Intense femtosecond x-ray pulses produced by an x-ray free-electron laser can trigger irreversible structural transitions in crystalline solids. For instance, irradiation of diamond can lead to graphitization and, at higher deposited doses, to amorphization. Our Monte Carlo simulations of irradiated diamond under realistic experimental conditions demonstrate that triggering graphitization or other phase transitions with hard x-ray photons can be challenging due to the ballistic escape of photoelectrons out of the beam focus. The decisive parameter here is the photoelectron range in proportion to the focal beam size. For future experiments on x-ray-induced transitions, such dedicated simulations of ballistic transport preceding the beamtime will be necessary. They can predict experimental conditions under which the desired distribution of the absorbed x-ray dose in the irradiated solid can be achieved.

X-ray laser-induced structural changes in silicon undergoing femtosecond melting have been investigated by using an x-ray pump-x-ray probe technique. The experimental results for different initial sample temperatures reveal that the onset time and the speed of the atomic disordering are independent of the initial temperature, suggesting that equilibrium atomic motion in the initial state does not play a pivotal role in the x-ray-induced ultrafast melting. By comparing the observed time-dependence of the atomic disordering and the dedicated theoretical simulations, we interpret that the energy transfer from the excited electrons to ions via electron-ion coupling (thermal effect) as well as a strong modification of the interatomic potential due to electron excitations (non-thermal effect) trigger the ultrafast atomic disordering. Our finding of the interplay of thermal and non-thermal effects in the x-ray-induced melting demonstrates that accurate modeling of intense x-ray interactions with matter is essential to ensure a correct interpretation of experiments using intense x-ray laser pulses.

Studies of light-induced demagnetization started with the experiment performed by Beaupaire et al. on Ni. Here, we present theoretical predictions for X-ray induced demagnetization of nickel, with X-ray photon energies tuned to its M_3 and L_3 absorption edges. We show that the specific feature in the density of states in the d -band of Ni, i.e., a sharp peak located just above the Fermi level, strongly influences the change of the predicted magnetic signal, making it stronger than in the previously studied case of X-ray demagnetized cobalt. It impacts also the value of Curie temperature for Ni. We believe that this finding will inspire dedicated experiments investigating magnetic processes in X-ray irradiated nickel and cobalt.

Theoretical analysis of X-ray free-electron-laser (FEL) experimental data requires development of dedicated computational tools able to follow the evolution of irradiated sample at ultrafast timescales and at strongly non-equilibrium conditions following the intense X-ray irradiation. Here we present three codes developed in our group, designed to follow electronic, magnetic and structural transitions in solid materials, triggered by X-ray FEL pulses. The reliability of modeling these transitions with our codes have been validated through numerous comparisons with the existing experimental data. Gradual release of the codes under DESY License conditions is planned.

Intense x-ray pulses can cause the non-thermal structural transformation of diamond. At the SACLA XFEL facility, pump x-ray pulses triggered this phase transition, and probe x-ray pulses produced diffraction patterns. Time delays were observed from 0 to 250 fs, and the x-ray dose varied from 0.9 to 8.0 eV/atom. The intensity of the (111), (220), and (311) diffraction peaks decreased with time, indicating a disordering of the crystal lattice. From a Debye-Waller analysis, the rms atomic displacements perpendicular to the (111) planes were observed to be significantly larger than those perpendicular to the (220) or (311) planes. At a long time delay of 33 ms, graphite (002) diffraction indicates that graphitization did occur above a threshold dose of 1.2 eV/atom. These experimental results are in qualitative agreement with XTANT+ simulations using a hybrid model based on density-functional tight-binding molecular dynamics.

Magnetization dynamics triggered with ultrashort laser pulses has been attracting significant attention, with strong focus on the dynamics excited by VIS/NIR pulses. Only recently, strong magnetic response in solid materials induced by intense X-ray pulses from free-electron lasers (FELs) has been observed. The exact mechanisms that trigger the X-ray induced demagnetization are not yet fully understood. They are subject of on-going experimental and theoretical investigations. Here, we present a theoretical analysis of electronic processes occurring during demagnetization of Co multilayer system irradiated by X-ray pulses tuned to L$_3$-absorption edge of cobalt. We show that, similarly as in the case of X-ray induced demagnetization at M-edge of Co, electronic processes play a predominant role in the demagnetization until the pulse fluence does not exceed the structural damage threshold. The impact of electronic processes can reasonably well explain the available experimental data, without a need to introduce the mechanism of stimulated elastic forward scattering.

X-ray diffraction of silicon irradiated with tightly focused femtosecond x-ray pulses (photon energy, 11.5 keV; pulse duration, 6 fs) was measured at various x-ray intensities up to 4.6×10^{19}  W/cm^{2}. The measurement reveals that the diffraction intensity is highly suppressed when the x-ray intensity reaches of the order of 10^{19}  W/cm^{2}. With a dedicated simulation, we confirm that the observed reduction of the diffraction intensity can be attributed to the femtosecond change in individual atomic scattering factors due to the ultrafast creation of highly ionized atoms through photoionization, Auger decay, and subsequent collisional ionization. We anticipate that this ultrafast reduction of atomic scattering factor will be a basis for new x-ray nonlinear techniques, such as pulse shortening and contrast variation x-ray scattering.

X-ray Free Electron Laser (XFEL) radiation may transform diamond into graphite. Two X-ray pulses were used; the first as pump to trigger the phase transition and the second as probe performing X-ray diffraction. The experiment was performed at the SACLA XFEL facility at the beamline 3 experimental hutch 5. The samples were polycrystalline diamond. The pump and probe photon energies were 7 and 10.5 keV, respectively, and the delay between the X-ray pulses was varied from 0 to 286 fs. To provide a range of energy densities, the X-ray focus was adjusted between 150 nm and 1 um. The (111), (220) and (311) diffraction peaks were observed. The intensity of each diffraction peak decreased with time indicating a disordering of the crystal lattice. From a Debye-Waller analysis, the root-mean-square (rms) atomic displacement perpendicular to particular lattice planes are calculated. At higher fluences, the rms atomic displacement perpendicular to the (111) planes is significantly larger than that perpendicular to the (220) or (311) planes. By accepting two successive XFEL pulses at a time delay of 33 ms, graphite (002) diffraction was observed beginning at a threshold dose of 1.7 eV/atom. The experimental results will be compared with calculations using a hybrid model based on tight-binding molecular dynamics.

Transient structural changes of Al_{2}O_{3} on subatomic length scales following irradiation with an intense x-ray laser pulse (photon energy: 8.70 keV; pulse duration: 6 fs; fluence: 8×10^{2}  J/cm^{2}) have been investigated by using an x-ray pump x-ray probe technique. The measurement reveals that aluminum and oxygen atoms remain in their original positions by ∼20  fs after the intensity maximum of the pump pulse, followed by directional atomic displacements at the fixed unit cell parameters. By comparing the experimental results and theoretical simulations, we interpret that electron excitation and relaxation triggered by the pump pulse modify the potential energy surface and drives the directional atomic displacements. Our results indicate that high-resolution x-ray structural analysis with the accuracy of 0.01 Å is feasible even with intense x-ray pulses by making the pulse duration shorter than the timescale needed to complete electron excitation and relaxation processes, which usually take up to a few tens of femtoseconds.

In this work, we report on modeling results obtained with our recently developed simulation tool enabling nanoscopic description of electronic processes in X-ray irradiated ferromagnetic materials. With this tool, we have studied the response of Co/Pt multilayer system irradiated by an ultrafast extreme ultraviolet pulse at the M-edge of Co (photon energy ~60 eV). It was previously investigated experimentally at the FERMI free-electron-laser facility, using the magnetic small-angle X-ray scattering technique. Our simulations show that the magnetic scattering signal from cobalt decreases on femtosecond timescales due to electronic excitation, relaxation, and transport processes both in the cobalt and in the platinum layers, following the trend observed in the experimental data. The confirmation of the predominant role of electronic processes for X-ray induced demagnetization in the regime below the structural damage threshold is a step toward quantitative control and manipulation of X-ray induced magnetic processes on femtosecond timescales.

Intense X-ray pulses from free-electron lasers can trigger ultrafast electronic, structural and magnetic transitions in solid materials, within a material volume which can be precisely shaped through adjustment of X-ray beam parameters. This opens unique prospects for material processing with X rays. However, any fundamental and applicational studies are in need of computational tools, able to predict material response to X-ray radiation. Here we present a dedicated computational approach developed to study X-ray induced transitions in a broad range of solid materials, including those of high chemical complexity. The latter becomes possible due to the implementation of the versatile density functional tight binding code DFTB+ to follow band structure evolution in irradiated materials. The outstanding performance of the implementation is demonstrated with a comparative study of XUV induced graphitization in diamond.

Measurement of transient optical properties (reflectivity and transmissivity) is frequently performed in X-ray/XUV pump – optical probe experiments. The optical properties reflect the transient state of irradiated materials. Here we propose to extend the material diagnostics with an additional measurement of the transient phase change of the optical probe pulse. It can be recorded in parallel to other transient optical properties, enabling an access to the information on the complex refractive index and the thickness of the radiation-modified material layer. The latter is necessary for investigations of phase transitions progressing in XUV (and X-ray) irradiated materials. In the talk, I present the results of a computational study of XUV irradiated silicon and diamond samples performed in [1]. It demonstrates that the measurement of the optical phase from a probe pulse at correctly tuned pulse parameters can provide a signal strong enough to extract information on transient material properties. Such phase measurement, feasible with modern experimental setups, can also be a basis for an improved diagnostics tool for the temporal characteristics of an ultrashort XUV pulse.

Ultrafast changes of charge density distribution in diamond after irradiation with an intense x-ray pulse (photon energy, 7.8 keV; pulse duration, 6 fs; intensity, 3×10^{19}  W/cm^{2}) have been visualized with the x-ray pump-x-ray probe technique. The measurement reveals that covalent bonds in diamond are broken and the electron distribution around each atom becomes almost isotropic within ∼5  fs after the intensity maximum of the x-ray pump pulse. The 15 fs time delay observed between the bond breaking and atomic disordering indicates nonisothermality of electron and lattice subsystems on this timescale. From these observations and simulation results, we interpret that the x-ray-induced change of the interatomic potential drives the ultrafast atomic disordering underway to the following nonthermal melting.

In this work, we analyze the application of X-ray diffraction imaging techniques to follow ultrafast structural transitions in solid materials using the example of an X-ray pump–X-ray probe experiment with a single-crystal silicon performed at a Linac Coherent Light Source. Due to the spatially non-uniform profile of the X-ray beam, the diffractive signal recorded in this experiment included contributions from crystal parts experiencing different fluences from the peak fluence down to zero. With our theoretical model, we could identify specific processes contributing to the silicon melting in those crystal regions, i.e., the non-thermal and thermal melting whose occurrences depended on the locally absorbed X-ray doses. We then constructed the total volume-integrated signal by summing up the coherent signal contributions (amplitudes) from the various crystal regions and found that this significantly differed from the signals obtained for a few selected uniform fluence values, including the peak fluence. This shows that the diffraction imaging signal obtained for a structurally damaged material after an impact of a non-uniform X-ray pump pulse cannot be always interpreted as the material’s response to a pulse of a specific (e.g., peak) fluence as it is sometimes believed. This observation has to be taken into account in planning and interpreting future experiments investigating structural changes in materials with X-ray diffraction imaging.

Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. This, in an ideal case, would imply a similar resolution for the temporal pulse properties and the arrival time jitter between the FEL and optical laser pulses. However, carrier transport within the material and out of its surface, as well as carrier recombination may, in addition, significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. Below we analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si _3 N _4 , on sub-picosecond timescales. Si _3 N _4 is a wide-gap insulating material widely used for FEL pulse diagnostics. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement. The comparison indicates that three body Auger recombination strongly affects the optical response of Si _3 N _4 after its collisional ionization stops. By deconvolving the contribution of Auger recombination, in future applications one could regain a high temporal resolution for the reconstruction of the FEL pulse properties measured with a Si _3 N _4 -based diagnostics tool.

Measurement of transient optical properties (reflectivity and transmissivity) is performed widely in extreme-ultraviolet (XUV) pump–optical probe experiments to study the transient state of irradiated materials. In order to extend the material diagnostics, here we propose an additional measurement of the transient phase change of the optical probe pulse. It can be recorded in parallel to other transient optical properties, enabling access to full information on the complex refractive index and thickness of the radiation-modified material layer. The latter is essential for investigations of phase transitions progressing in XUV (and x-ray) irradiated materials. We perform a computational study that clearly shows that the measurement of the optical phase from a probe pulse at correctly tuned pulse parameters can provide a signal strong enough to extract information on transient material properties. The calculations suggest that in some cases, it is even more preferable to measure the transient phase change than other optical parameters. Such phase measurement, feasible with modern experimental setups, can then be a basis for an improved diagnostics tool for the temporal characteristics of an ultrashort XUV pulse.

Intense fs-XUV laser-induced transient optical properties following free electron generation are investigated experimentally and theoretically. Electron-dynamics and resulting transient changes of the reflectivity and transmissivity and recently also the change of phase of an additional fs-probe pulse is considered. This completes the information of optical properties during the interaction process, which is of importance for basic research and diagnostic purposes.

XUV pulses at 26.2 nm wavelength were applied to induce graphitization of diamond through a non-thermal solid-to-solid phase transition. This process was observed within poly-crystalline diamond with a time-resolved experiment using ultrashort XUV pulses and cross correlated by ultrashort optical laser pulses. This scheme enabled for the first time the measurement of a phase transition on a timescale of ~150 fs. Excellent agreement between experiment and theoretical predictions was found, using a dedicated code that followed the non-equilibrium evolution of the irradiated diamond including all transient electronic and structural changes. These observations confirm that ultrashort XUV pulses can induce a non-thermal ultrafast solid-to-solid phase transition on a hundred femtosecond timescale.

Modern free-electron lasers (FEL) operating in XUV (extreme ultraviolet) or X-ray range allow an access to novel research areas. An example is the ultrafast ionization of a solid by an intense femtosecond FEL pulse in XUV which consequently leads to a change of the complex index of refraction on an ultrashort timescale. The photoionization and subsequent impact ionization resulting in electronic and atomic dynamics are modeled with our hybrid code XTANT(X-ray thermal and non-thermal transitions) and a Monte Carlo code XCASCADE(X-ray-induced electron cascades). The simulations predict the temporal kinetics of FEL-induced electron cascades and thus yield temporally and spatially resolved information on the induced changes of the optical properties. In a series of experiments at FERMI and LCLS, single shot measurements with spatio-temporal encoding of the ionization process have been performed by a correlation of the FEL pump pulse with an optical femtosecond probe pulse. An excellent agreement between the experiment and the simulation has been found. We also show that such kind of experiments forms the basis for pulse duration and arrival time jitter monitoring as currently under development for XUV-FELs.