A new type of normal incidence scanning reflectometer is designed and constructed. In the system design, instead of using a reference reflective sample or the optical path adjustment methods as in traditional design, we use a fused quartz M-type prism to split the beam of incidence light into two beams in a total internal reflection configuration. The spot sizes, intensities, and spectral responses of these two light beams, therefore, are identical. One reference beam goes directly to the detector. Another sampling beam goes to the sample and is measured by the same detector after beam reflection. A metal disk having three holes is driven precisely by a stepping motor and is used to control the reference and reflection beams as well as the background signals, which are measured in sequence. In terms of the three signals, the absolute reflectivity of the sample at a certain wavelength can be determined immediately using the computer. The system is controlled automatically by the computer with a working wavelength range from 400 to 800 nm. The incidence angle is fixed and equals about 5 deg. The details of the system design, optical configuration, and error reduction are given and discussed. The measured spectral results of the reflectivity for a few testing samples are also given, and are shown to be in good agreement with those measured by other optical methods. The designed system, however, is simpler and can be used in many optical studies.

By using the magneto-optical and transmission-ellipsometric methods, giant anisotropy in both optical and magneto-optical properties was found for the single crystal Cd1−xMnxTe (x = 0.45). Two orthogonal axes E⊥ and E|, were in the (1 1 3) plane, and along the [4 7 1] and [2 1 1] directions, respectively. The crystal has two refractive indexes of n⊥ and n| and can be made a zero-field retarder. Not only the micro twin crystalline structure but also possibly the order replacement of Cd2+ by Mn2+ with induced lattice distortion through the whole body of the crystal along the [1 1 1] orientation can cause the optical and magneto-optical anisotropy. Both transmission-ellipsometric and magneto-optic Faraday rotation spectra located peaks at the same ∼2 eV EMn position, that was in the gap between the conduction and valence bands. In discussion, EMn was attributed to the optical transition of Te p → Mn d↓. A better understanding of Cd1−xMnxTe anisotropy will reveal further the behavior of Mn2+ that can account for the properties of the crystal.

A new type of spectroscopic ellipsometer with polarizer and analyzer rotating synchronously at a speed ratio of 1:2, has been designed and constructed. An additional source polarizer was used to reduce the slight polarization effects of the light source. The light intensity includes one DC and four AC components, having the frequencies of ��, 2��, 3�� and 4�� respectively. Complex dielectric spectra can be obtained by calculating any three of the four AC signals, having data self-consistency of better than 0.5%. The design, alignment and calibration of the system were discussed in detail. The results of measured spectra of Au and CdTe in the 1.5-4.5 eV range were presented and shown to be in agreement with the results of other reports.

2MeV N+-implanted GaSb samples with various doses were prepared for optical studies by use of PL, SE, RBS/C, and SEM methods. No swelling is observed on the implanted samples. The results obtained from SE are in agreement with those from RBS/C. By fitting the SE results with EMA model, a quantitative knowledge about the damage of the samples is achieved.

A new type of the normal incidence scanning reflectometer, in which a M-type prism is used to split a light beam, has been designed and constructed. Measurement error caused by the optical system of this reflectometer has been reduced to the minimum. Influence of the electromagnetic field and position of light spot on the detector and linearity of the multiplier phototube on the measurement accuracy was respectively discussed. The incident angle is about 5�� and the photon energy region is from 1.5 to 3eV. The measurement was controlled automatically by a computer. The measuring precision is about 0.01. Reflectance of Au film measured by this reflectometer was compared with that measured by an ellipsometer and they agree with each other very well.

The thickness of super-thin SiO2 film grown by rapid thermal oxidation and the refractive index were measured by using angle-variable ellipsometry. The growth characteristics of rapid thermal oxidation were studied and the temperature activation energy for the oxidation growth rate was calculated. The relation between the thickness of the film and the refractive index was discussed.

In this paper the results of ferromagnetic resonance study of sputtered Co/Pt multilayers, with a fixed Co layer thickness of 15 Å, are presented. For these multilayers with small Pt layer thickness, in addition to a uniform resonance mode, a spin wave resonance mode is found to exist, which confirms the existence of an interlayer coupling between the neighboring Co layers. Simultaneously, the effective magnetization 4πMeff and the resonance linewidth ΔH are found to change correlatively with varying Pt layer thickness. This phenomenon can be explained as a result of an interplay between the interlayer coupling and the low-dimensional effect.

In this paper calculated magneto-optical Kerr rotation spectra of Co/Pd, Co/Pt, and Co/Cu multilayers are presented. For Co/Pd and Co/Pt multilayers with a top Co layer the size of Kerr rotation \theta(K)\ increases with increasing modulation wavelength. For Co/Cu multilayers with a top Co layer \theta(K)\ increases with modulation wavelength increasing to 40 nm and then decreases with the modulation wavelength further increasing to 60 nm. For all these multilayers with a top non-magnetic layer \theta(K)\ decreases with increasing modulation wavelength. The optical constant effect of the non-magnetic sublayer is discussed.

physica status solidi (b)Volume 180, Issue 1 p. K39-K43 Short Note Anomalous Magneto-Optics in Fe-Si/Cu Multilayers Shi-Ming Zhou, Shi-Ming Zhou Department of Physics, Fudan University, Shanghai Search for more papers by this authorLiang-Yao Chen, Liang-Yao Chen Department of Physics, Fudan University, Shanghai Search for more papers by this authorYi Su, Yi Su Department of Physics, Fudan University, Shanghai Search for more papers by this authorXing-Wei Feng, Xing-Wei Feng Department of Physics, Fudan University, Shanghai Search for more papers by this authorYou-Hua Qian, You-Hua Qian Department of Physics, Fudan University, Shanghai Search for more papers by this authorXi-De Xie, Xi-De Xie Department of Physics, Fudan University, Shanghai Search for more papers by this author Shi-Ming Zhou, Shi-Ming Zhou Department of Physics, Fudan University, Shanghai Search for more papers by this authorLiang-Yao Chen, Liang-Yao Chen Department of Physics, Fudan University, Shanghai Search for more papers by this authorYi Su, Yi Su Department of Physics, Fudan University, Shanghai Search for more papers by this authorXing-Wei Feng, Xing-Wei Feng Department of Physics, Fudan University, Shanghai Search for more papers by this authorYou-Hua Qian, You-Hua Qian Department of Physics, Fudan University, Shanghai Search for more papers by this authorXi-De Xie, Xi-De Xie Department of Physics, Fudan University, Shanghai Search for more papers by this author First published: 1 November 1993 https://doi.org/10.1002/pssb.2221800136 Shanghai 200433, People's Republic of China. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Volume180, Issue11 November 1993Pages K39-K43 RelatedInformation

In this paper we present the calculated magneto-optical Kerr rotation spectra of Fe/Pd and Co/Pd multilayers based on two different assumptions. Firstly the spin-polarization of the Pd layers and its additional magneto-optical Kerr effect in Fe/Pd and Co/Pd multilayers are assumed negligibly small. Secondly the Pd layer is assumed to be spin-polarized. The calculated spectra with the latter assumption agree with the measured spectra by modifying the parameters. The Pd layers are suggested to induce an additional magneto-optical Kerr effect and thus enhance magneto-optical Kerr effect in these multilayers.

The magnetic and magneto-optical properties of Fe-Si/Pd multilayers prepared by rf sputtering were studied. For Fe-Si/Pd multilayers with a fixed Fe-Si layer thickness dm of 15 Å and the Pd layer thickness dp increasing from 10.8 to 18 Å, the saturation magnetization Ms and the Kerr rotation θk decrease sharply and reach a minimum. With dp further increasing, the multilayers increase. Ms is almost constant and θk decreases slightly when dp≳36 Å. For Fe-Si/Pd (54 Å) multilayers the room temperature Ms decreases and θk increases, respectively, with increasing dm. This is caused by the spin-polarization effect of Pd atoms near the interfaces.

An improved type of scanning and analyzer rotating magneto-optic spectroscopy has been designed and constructed. By adding an achromatic quart-wavelength retarder to the system and using Fourier transformation, the complete magneto-optic parameters, both polar Kerr rotation angle 6kand ellipticity k' have been measured in the 1.5-5-eV photon energy range and at a near normal incident angle of less than 2 degrees. A fine step motor with 1000 steps per revolution and a hollow shaft, on which the analyzer is directly mounted, is used to control precisely the analyzer azimuthal angle. The magnetic field, spectral scanning, and retarder position, as well as data processing are totally controlled by a microcomputer. The magneto-optic spectral results of the system is illustrated for FeTeCo film samples.