基本信息
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职业迁徙
个人简介
I am a physicist devising ways to analyse difficult samples, mostly using Secondary Ion mass Spectrometry (SIMS) for chemical and isotopic measurement. My background is in ion optics, UHV engineering, semiconductors and microscopy and I was part owner of a contract analysis service. In my current role at Hiden I am in the envious position to be able to design and modify spectrometers as well as engage and collaborate with external researchers and I always relish a new analytical challenge.
研究兴趣
论文共 29 篇作者统计合作学者相似作者
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期刊级别
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Nanoenergy advancesno. 2 (2024): 174-195
Microscopy and microanalysisno. S1 (2021): 1012-1015
Surface and interface analysisno. S1 (2014): 372-374
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作者统计
#Papers: 29
#Citation: 349
H-Index: 10
G-Index: 18
Sociability: 5
Diversity: 2
Activity: 5
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