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Papers共 16 篇Author StatisticsCo-AuthorSimilar Experts
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Padraig Timoney, Carrie Yurkon,Jusang Lee, Mark Altwerger,Felix Beaudoin, Aarthi Sundaram, Bert Pfefferling
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2023)
Padraig Timoney, Joseph Luke,Mark Rovereto, Jordan Wyble, Cheng-Ting Lien, Zahir Alamgir,Eswar Ramanathan
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-3, (2023)
Paul K. Isbester,Ganesh Subramanian,Padraig Timoney,Taher Kagalwala,Dmitry Kislitsyn,Heath Pois,Mark Klare,Daniel Kandel, Michal Yachini,Wei Ti Lee, Vanessa Zhang, Mitch Shiver, Saurabh Singh, Parker Lund
Metrology, Inspection, and Process Control XXXVI (2022)
Padraig R. Timoney, Roma Luthra, Alex Elia, Haibo Liu,Paul K. Isbester, Avi Levy,Michael Shifrin,Barak Bringoltz,Eylon Rabinovich,Ariel Broitman,Eitan Rothstein, Ran Jacoby, Ilya Rubinovich,Yongha Kim, Ofer Shlagman, Barak Ben-Nahum, Marina Zolkin,Igor Turovets
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
Taher Kagalwala,Padraig Timoney, Ronald Fiege, Jason Emans, Timothy Hughes,Alexander Elia,Alok Vaid,Susan Emans, Benny Vilge,Marjorie Cheng,Charles Kang, Darren Zingerman, Kevin Drayton,Naren Yellai,Matthew Sendelbach
Proceedings of SPIE (2018): 417-422
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXII (2018)
Padraig Timoney,Alok Vaid, Byeong Cheol Kang,Haibo Liu,Paul Isbester,Marjorie Cheng, Susan Ng-Emans,Naren Yellai, Matt Sendelbach,Roy Koret,Oram Gedalia
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Author Statistics
#Papers: 16
#Citation: 28
H-Index: 3
G-Index: 4
Sociability: 4
Diversity: 1
Activity: 0
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