基本信息
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职业迁徙
个人简介
Cong Hu received the B.S. degree in computer science and technology and the M.S. degree in test and measurement technology and instruments from the Guilin University of Electronic Technology, Guilin, China, in 2003 and 2006, respectively, and the Ph.D. degree in test and measurement technology and instruments from Xidian University, Xi’an, China, in 2017.
He is currently a Professor with the Guilin University of Electronic Technology. His current research interests include design-for-testability, test optimization techniques for many-core designs, fault diagnosis, and deep learning.
研究兴趣
论文共 5 篇作者统计合作学者相似作者
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引用量
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期刊级别
合作者
合作机构
Wireless networksno. 8 (2023): 3637-3663
IEEE transactions on very large scale integration (VLSI) systemsno. 6 (2023): 861-873
IEEE access (2023): 2721-2728
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 10 (2022): 3543-3547
作者统计
#Papers: 5
#Citation: 2
H-Index: 1
G-Index: 1
Sociability: 2
Diversity: 1
Activity: 2
合作学者
合作机构
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