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个人简介
Tianming Ni received the Ph.D. degree in integrated circuits and systems from the Hefei University of Technology, Hefei, China, in 2018.
He is currently an Associate Professor and a Master Supervisor with the College of Electrical Engineering, Anhui Polytechnic University, Wuhu, China. He was selected as the “Young Wanjiang scholar” in Anhui Province, and he has taken charge of many projects (e.g., National Natural Science Foundation of China; Anhui Provincial Natural Science Foundation; and the Key Projects of Natural Science Research of Universities in Anhui Province), and CCF-Tecent “rhinobird” creativity award fund. His research interest includes VLSI testing, design for reliability, fault tolerance, 3D-IC TSV tolerant design, machine learning for IC testing, and so on.
Dr. Ni is currently an Associate Editor for Microelectronics Journal and Journal of Electronics and Information Technology.
研究兴趣
论文共 2 篇作者统计合作学者相似作者
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MICROELECTRONICS JOURNAL (2024)
Senling Wang,Shaoqi Wei, Jun Ma,Hiroshi Kai,Yoshinobu Higami,Hiroshi Takahashi, Akihiro Shimizu,Xiaoqing Wen,Tianming Ni
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)pp.1-3, (2023)
作者统计
#Papers: 2
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