基本信息
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职业迁徙
个人简介
He has worked on phase modulation in alignment sensors, and has built up a reputation both within the company and among customers as an expert in metrology and in alignment, focus, and leveling systems. Arie is highly skilled at translating customer needs into inventions. He delivers a graduate-level course on optical wafer metrology techniques and conducts research on the use of computational imaging techniques for metrology.
研究兴趣
论文共 107 篇作者统计合作学者相似作者
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Tamar van Gardingen-Cromwijk, Sander Konijnenberg, Wim Coene,Manashee Adhikary, Teus Tukker,Stefan Witte,Johannes F. de Boer,Arie den Boef
Light Advanced Manufacturingno. 4 (2024): 453-465
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3no. 2 (2023)
Manashee Adhikary, Tamar Cromwijk, Sander Konijnenberg, W. Coene, Stefan Witte, J. de Boer,Arie den Boef
openalex(2023)
openalex(2023)
Optics continuumno. 5 (2022): 1202-1202
C. Messinis,T. T. M. van Schaijk,N. Pandey, V. T. Tenner, A. Koolen,S. Witte,J. F. de Boer,A. J. den Boef
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI (2022)
Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP) (2022)
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021)
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作者统计
#Papers: 105
#Citation: 2705
H-Index: 28
G-Index: 44
Sociability: 6
Diversity: 0
Activity: 0
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