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论文共 27 篇作者统计合作学者相似作者
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Ian O'Connor, Sara Mannaa,Alberto Bosio,Bastien Deveautour,Damien Deleruyelle, Tetiana Obukhova,Cédric Marchand,Jens Trommer,Cigdem Cakirlar,Bruno Neckel Wesling, Thomas Mikolajick,Oskar Baumgartner,
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)pp.1-6, (2024)
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Marcello Traiola,Salvatore Pappalardo,Ali Piri,Annachiara Ruospo,Bastien Deveautour,Ernesto Sánchez, Alberto Bosio,Sepide Saeedi,Alessio Carpegna, Anil Bayram Gogebakan, Enrico Magliano,Alessandro Savino
IEEE European Test Symposiumpp.1-10, (2024)
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) (2024): 19-24
Ian O'Connor, Sara Mannaa, Alberto Bosio,Bastien Deveautour,Damien Deleruyelle, Tetiana Obukhova,Cédric Marchand,Jens Trommer,Çigdem Çakirlar,Bruno Neckel Wesling, Thomas Mikolajick,Oskar Baumgartner,
Design, Automation, and Test in Europepp.1-6, (2024)
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IEEE VLSI Test Symposiumpp.1-11, (2024)
Alba Ordonez Rodriguez,Fabien Gilibert, Francois Paolini,Pascal Urard,Roberto Guizzetti,John Samuel,Remy Cellier, Lioua Labrak,Bastien Deveautour
IEEE JOURNAL ON EXPLORATORY SOLID-STATE COMPUTATIONAL DEVICES AND CIRCUITSno. 2 (2023): 116-123
2023 International Conference on Microelectronics (ICM)pp.325-334, (2023)
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)pp.181-186, (2023)
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)pp.1-6, (2023)
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