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个人简介
John S. Suehle (F’12) received the B.S., M.S., and Ph.D. degrees in electrical engineering from the University of Maryland at College Park, College Park, MD, USA, in 1980, 1982, and 1988, respectively.
He has been with the National Institute of Standards and Technology, Gaithersburg, MD, USA, since 1982. He has authored or co-authored over 200 technical papers or conference proceedings, several book chapters, and holds five U.S. patents. His current research interests include failure and wear-out mechanisms in semiconductor devices, radiation effects in microelectronics, microelectromechanical systems, and nanobiology.
Dr. Suehle is a member of Eta Kappa Nu. He served as the General Chair of the International Reliability Physics Symposium in 2008, and is the General Chair of the 2015 International Electron Device Meeting. He has served on the Editorial Board of the IEEE Transactions on Electron Devices from 2006 to 2012.
研究兴趣
论文共 87 篇作者统计合作学者相似作者
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T. Emge, E. Garfunkela,Xinyuan Zhao,L. Wielunski,R. A. Bartynski,David Vanderbilt,J. S. Suehle,S. Suzer
semanticscholar(2013)
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作者统计
#Papers: 87
#Citation: 3228
H-Index: 27
G-Index: 56
Sociability: 6
Diversity: 3
Activity: 0
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