基本信息
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职业迁徙
个人简介
Kuo Tian was born in China in 1982. He received the B.S. degree in electronic engineering from Tsinghua University, Beijing, China, in 2005. He is currently pursuing the M.S. degree in microelectronics in the Institute of Microelectronics, Tsinghua University.
His research interests are MEMS, piezoresistive, and MOSFET stress sensors and their application in electronic packaging and chip reliability issues.
研究兴趣
论文共 51 篇作者统计合作学者相似作者
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D. Bernardi,F. Arbeiter,M. Cappelli,U. Fischer, A. Garcia,R. Heidinger,W. Krolas,F. Martin-Fuertes,G. Micciche,A. Munoz,F. S. Nitti, M. Perez, T. Firma,K. Tian,A. Ibarra
A. Aiello,P. Arena,P. A. Di Maio, B. Ferrucci,R. Forte,M. Frisoni, J. Galabert,B. E. Ghidersa, M. Granieri,C. Ortiz,M. Polidori,I. Ricapito,A. Tincani,K. Tian, K. Voukelatou
Kuo Tian,Begoña Ahedo,Frederik Arbeiter,Germán Barrera,Łukasz Ciupiński,Tamás Dézsi,Jonathan Horne, Dániel Kovács,J. Molla,F. Mota,Yuefeng Qiu,Florian Schwab,Marcin Siwek,Mátyás Tóth, Tamás Varga,A. Ibarra
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作者统计
#Papers: 51
#Citation: 702
H-Index: 16
G-Index: 25
Sociability: 5
Diversity: 3
Activity: 0
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