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Richard F Hafer received the B.S. degree from the Colorado School of Mines in 1997, the M.S. degree from the University of Colorado in 1999, both in chemical engineering, and the M.B.A. degree from the University of Colorado in 2006.
He started his career in viscometry research with the NIST Thermophysics Division. His focus then shifted to silicon and thin-film photovoltaics. He has contributed in several areas such as process engineering and development, failure analysis, in-line defect detection, and in-line electrical tests. He is currently focusing on electron beam inspection with GlobalFoundries, East Fishkill, NY, USA.
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论文共 22 篇作者统计合作学者相似作者
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ISTFA 2017: CONFERENCE PROCEEDINGS FROM THE 43RD INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (2017)
Stephen Lucarini, Bachir Dirahoui,Richard Hafer,Weihao Weng, Laura Safran, Sweta Pendyala,Karl W. Barth,Timothy A. Brunner,Zhigang Song,Brett Engel, David Kingsley Clark,Keliang He,
Oliver D. Patterson,Richard F. Hafer, Surbhi Mittal,Ankur Arya,Kenneth Stein, Herbert L. Ho,William Davies,Xiaohu Tang, Brian Yueh-Ling Hsieh,Shuen-Cheng Chris Lei
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