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Todora Angelova received the M.S. degree in physics from Sofia’s University St. Kliment Ohridsky, Bulgaria, in 1998, and the Ph.D. degree from the Applied Physic Department, University of Valencia, Spain, in 2010. She is currently a Process Development Engineer with the Nanophotonics Technology Center of Valencia (NTC). Her research interests include the fabrication, characterization and application of graphene and thin film semiconductors materials and devices. In particular, she is active in experimental studies on Plasma Enhanced Chemical Vapour Deposition (PECVD) layers. Her work can also be filled with knowledge in characterization techniques like Raman scattering, Spectroscopic Ellipsometry and Atomic force microscopy (AFM).
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arxiv(2023)
2020 IEEE Photonics Conference (IPC)pp.1-2, (2020)
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Proceedings of SPIE (2020)
OSA Advanced Photonics Congress (AP) 2020 (IPR, NP, NOMA, Networks, PVLED, PSC, SPPCom, SOF) (2020)
2017 19th International Conference on Transparent Optical Networks (ICTON) (2017): 1-4
INTEGRATED OPTICS: DEVICES, MATERIALS, AND TECHNOLOGIES XXI (2017)
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