基本信息
浏览量:35
职业迁徙
个人简介
Starting with his Ph.D. work Prof. Eisenstadt has more than 20 years experience in developing microwave test and performing analog and RF/microwave IC design. He has strong expertise in the use of s-parameter equipment (HP 8510, Cascade probes), Load-pull equipment (Maury Microwave), high-speed sampling oscilloscope measurements, integrated picosecond photoconductor-based sampling systems and RF and microwave embedded test elements for production IC test. Eisenstadt and Bockelman developed mixed-mode s-parameters (differential and common-mode) for characterization of differential IC designs (7 papers, 3 patents). Eisenstadt and Eo developed measurement-based extraction of microwave IC interconnect parameters and continue to publish in the field (~20 papers). Currently, Eisenstadt is leading research in embedding RF tests in the IC to reduce production and manufacturing test costs. In this work, he leads the development of compact structures that source and detect RF/microwave and signals on the IC.
Prof. Eisenstadt has published over 90 journal articles and conference papers and 6 patents. In 1985 he was awarded the NSF Presidential Young Investigator Award. He is Technical Program Chair of the 64th ARFTG Microwave Measurement Conference in Orlando, FL , Dec. 2004 and is on the Program Committee of the Wireless Test Workshop and the ISCAS, Analog Signal Processing Technical Committee, ASTPC, 2003 to present.
研究兴趣
论文共 13 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
William R. Eisenstadt, Mark Roos, Devin Morris,José Luis González-Jiménez, Christopery Mounet,Manuel J. Barragan,Gildas Leger,Florent Cilici,Estelle Lauga-Larroze,Salvador Mir,Sylvain Bourdel,M. Margalef-Rovira,
2005 66th ARFTG Microwave Measurement Conference (ARFTG) (2005)
IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 4 (2004): 395-407
加载更多
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn