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ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSISpp.66-70, (2010)
Stefan Zollner,Richard B. Gregory,M. L. Kottke,Victor Vartanian,Xiang-Dong Wang,David Theodore,P. L. Fejes,J. R. Conner,Mark Raymond, Xiaoyan Zhu,Dean Denning,Scott Bolton,Kyuhwan Chang,Ross Noble,Mohamad Jahanbani,Marc Rossow,Darren Goedeke, Stan Filipiak, Ricardo Garcia,Dharmesh Jawarani, Bill Taylor,Bich-Yen Nguyen,P. E. Crabtree,Aaron Thean
AIP conference proceedings (2007)
Bich-Yen Nguyen,Aaron Thean,Da Zhang,Ted White,Mariam Sadaka,Dina Triyoso, Jamie Schaeffer,Brian Goolsby, Thien Nguyen,Veer Dhandapani,Victor Vartanian,Linda McCormick,David Theodore,Stefan Zollner, Qianghau Xie,Xiang-Dong Wang,Zhanghai Shi,Leo Mathew, Melissa Zavala,Colita Parker, Heather Collard,Jill Hildreth,Lata Prabhu,Raghaw Rai, Sharon Murphy, Patrick Montgomery,Sriram Kalpat,Michael Ramon,David Gilmer,Bill Taylor,Alex Demkov,Vance Adams,Jack Jiang, Jian Chen, Cheng-Hung Chang,Vidya Kaushik, Luna Chandna, Mike Sadd,Alex Barr,Anne Vandooren,Daniel Pham, Mike Mendicino, Jon Cheek, Hsing Tseng,Bruce White,Phil Tobin,Marius Orlowski,Suresh Venkatesan, Venkat Kolagunta,Joe Mogab,M. Canonico,M. Kottke
ECS Meeting Abstractsno. 14 (2006): 637-637
Proceedings - Electrochemical Societyno. null (2004): 493-500
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#Papers: 12
#Citation: 28
H-Index: 3
G-Index: 5
Sociability: 5
Diversity: 2
Activity: 0
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