基本信息
浏览量:0
职业迁徙
个人简介
暂无内容
研究兴趣
论文共 10 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
引用0浏览0引用
0
0
Chih-I Wei,Seul-Ki Kang,Sayantan Das,Masahiro Oya,Yosuke Okamoto, Kotaro Maruyama,Germain Fenger, Azat Latypov,Ir Kusnadi,Gurdaman Khaira,Yuichiro Yamazaki,Werner Gillijns,
Journal of micro/nanopatterning, materials, and metrologyno. 04 (2023)
引用0浏览0引用
0
0
Taihei Mori,Yosuke Okamoto,Masahiro Oya, Shinji Mizutani, Shinichi Nakazawa, Kotaro Maruyama,Yuichiro Yamazaki
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI (2022)
Chih-I Wei, Stewart Wu,Yunfei Deng,Gurdaman Khaira,Ir Kusnadi,Germain Fenger,Seulki Kang,Yosuke Okamoto, Kotaro Maruyama,Yuichiro Yamazaki,Sayantan Das,Sandip Halder,
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021): 220-231
Seulki Kang, Kotaro Maruyama,Yuichiro Yamazaki,Danilo De Simone, Paulina Rincon-Delgadillo,Andreas Frommhold,Gian Lorusso,Sayantan Das,Sandip Halder,Philippe Leray
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021): 541-549
Yosuke Okamoto, Shinichi Nakazawa,Akinori Kawamura,Taihei Mori, Kotaro Maruyama,Seulki Kang,Yuichiro Yamazaki
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021): 464-471
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
Yosuke Okamoto, Shinichi Nakazawa,Akinori Kawamura, Tsugihiko Haga,Taihei Mori, Kotaro Maruyama,Seul-Ki Kang,Yuichiro Yamazaki
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn