State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size

Three issues that are dominating test research today are test application time, test data volume and test power. Researchers have focused on these issues mostly considering the popular serial scan architecture for its relatively low hardware overhead while ignoring the fact that exponential drop in hardware cost offers opportunities for implementing a test architecture that previously may have been un-acceptable. This paper takes such a paradigm shift into account and studies the simultaneous solution of all three problems of serial scan by making use of progressive random access scan test architecture. This architecture only increases the hardware cost marginally while providing marked improvements for the three issues. This paper explains the test architecture and then develops a test generation methodology which reduces the test application time by nearly 75%, test data volume by 50% for the benchmark circuits. Above all, the architecture is inherently so efficient that it reduces the test power by nearly 99% or more of the test power consumption compared to serial scan.