MILC-TFT With High- $\kappa$ Dielectrics for One-Time-Programmable Memory Application

IEEE Electron Device Letters(2009)

引用 6|浏览7
暂无评分
摘要
In this letter, for the first time, one-time-programmable (OTP) memory fabricated on the low-temperature poly-Si p-channel thin-film transistor (TFT) with metal-induced lateral-crystallization channel layer and high-kappa dielectrics is demonstrated. The state of this OTP memory can be identified by the scheme of gate-induced drain leakage current measurement. The OTP-TFT memory has good electrica...
更多
查看译文
关键词
Thin film transistors,Nonvolatile memory,Threshold voltage,Crystallization,Hafnium oxide,Dielectric devices,Chaos,Current measurement,Dielectric measurements,Circuits
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要