Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories.

On-chip process monitor/sensor circuits capture the process corner of a chip in the postfabrication stage. Logic-NMOS and logic-PMOS based sensors, however, fail to capture the process corners for memories, as bitcells have a different implant from logic cells. In this paper, a novel on-chip bitcell-based process monitor (BPMON) circuit is implemented that distinguishes between and detects the sta...