Measurement of B(Λ c + →pK - π + )

D. E. Jaffe,G. Masek,H. P. Paar,E. M. Potter, S. Prell, V. Sharma,D. M. Asner,A. Eppich, J. Gronberg, T. S. Hill,D. J. Lange,R. J. Morrison,R. A. Briere,B. H. Behrens, W. T. Ford, A. Gritsan,J. Roy,J. G. Smith, J. P. Alexander,R. Baker, C. Bebek,B. E. Berger, K. Berkelman,F. Blanc, V. Boisvert, D. G. Cassel,M. Dickson, P. S. Drell,K. M. Ecklund, R. Ehrlich, A. D. Poland, P. Gaidarev, L. Gibbons, B. Gittelman,S. W. Gray, D. L. Hartill, B. K. Heltsley,P. I. Hopman,C. D. Jones, D. L. Kreinick,M. Lohner,A. Magerkurth, T. O. Meyer, N. B. Mistry, C. R. Ng, E. Nordberg,J. R. Patterson, D. Peterson, D. Riley,Jon J Thaler, P. G. Thies, B. Valant-Spaight,A. Warburton, P. Avery, C. Prescott,A. I. Rubiera, J. Yelton, J. Zheng, G. Brandenburg, A. Ershov, Y. S. Gao,D. Y.J. Kim,R. Wilson,T. E. Browder,Y. Li,J. L. Rodriguez, H. Yamamoto,T. Bergfeld, B. I. Eisenstein, J. Ernst, G. E. Gladding,George D Gollin,R. M. Hans,E. Johnson, I. Karliner,M. A. Marsh,M. Palmer, C. Plager, C. Sedlack,Mats A Selen,J. J. Thaler,J. Williams, K. W. Edwards, R. Janicek,P. M. Patel,A. J. Sadoff,R. Ammar, P. Baringer,A. Bean, D. Besson,P. Brabant, M. Cervantes,I. Kravchenko, R. P. Stutz,X. Zhao,S. Anderson, V. V. Frolov,Y. Kubota,S. J. Lee,R. Mahapatra, J. J. O'Neill,R. Poling,T. Riehle,A. Smith, J. Urheim,S. Ahmed,M. S. Alam,S. B. Athar, L. Jian,L. Ling,A. H. Mahmood,M. Saleem, S. Timm, F. Wappler, A. Anastassov,J. E. Duboscq,K. K. Gan, C. Gwon, T. Hart, K. Honscheid,D. Hufnagel, H. Kagan, R. Kass,J. Lorenc, T. K. Pedlar,H. Schwarthoff, E. Von Toerne, M. M. Zoeller, S. J. Richichi,H. Severini, P. Skubic, A. Undrus,S. Chen,J. Fast,J. W. Hinson,J. Lee,N. Menon,D. H. Miller, E. I. Shibata, I. P.J. Shipsey, V. Pavlunin, D. Cronin-Hennessy, Y. Kwon, A. L. Lyon, E. H. Thorndike, C. P. Jessop,H. Marsiske,M. L. Perl, V. Savinov, D. Ugolini,X. Zhou,T. E. Coan, V. Fadeyev, I. Korolkov, Y. Maravin,I. Narsky, R. Stroynowski,J. Ye, T. Wlodek,M. Artuso,R. Ayad, C. Boulahouache, K. Bukin,E. Dambasuren, S. Karamov,S. Kopp, G. Majumder, G. C. Moneti,R. Mountain,S. Schuh, T. Skwarnicki,S. Stone,G. Viehhauser,J. C. Wang,A. Wolf, J. Wu, S. E. Csorna,I. Danko, K. W. McLean,Sz Márka, Z. Xu, R. Godang, K. Kinoshita, I. C. Lai,S. Schrenk, G. Bonvicini,D. Cinabro, L. P. Perera,G. J. Zhou, G. Eigen, E. Lipeles,M. Schmidtler,A. Shapiro, W. M. Sun, A. J. Weinstein, F. Würthwein

Physical Review D(2000)

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摘要
The {lambda}{sub c}{sup +}{yields}pK{sup -}{pi}{sup +} yield has been measured in a sample of two-jet continuum events containing both a charm tag (''D(bar sign)'') as well as an antiproton (e{sup +}e{sup -}{yields}D(bar sign)p(bar sign)X), with the antiproton in the hemisphere opposite the D(bar sign) (measurement of charge conjugate modes is implicit throughout). Under the hypothesis that such selection criteria tag e{sup +}e{sup -}{yields}D(bar sign)p(bar sign){lambda}{sub c}{sup +}X events, the {lambda}{sub c}{sup +}{yields}pK{sup -}{pi}{sup +} branching fraction can be determined by measuring the pK{sup -}{pi}{sup +} yield in the same hemisphere as the antiprotons in our D(bar sign)p(bar sign)X sample. Three types of D(bar sign) charm tags are used, {pi}{sub soft}{sup -} (from D{sup *-}{yields}D(bar sign){sup 0}{pi}{sub soft}{sup -}), electrons (from D(bar sign){yields}Xe{sup -}{nu}), and fully reconstructed D(bar sign){sup 0}{yields}K{sup +}{pi}{sup -} or D{sup -}{yields}K{sup +}{pi}{sup -}{pi}{sup -} or D{sub s}{sup -}{yields}{phi}{pi}{sup -}. Combining our results obtained from the three independent charm tags, we obtain B({lambda}{sub c}{sup +}{yields}pK{sup -}{pi}{sup +})=(5.0{+-}0.5{+-}1.2)%. (c) 2000 The American Physical Society.
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